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Microstructure analysis of the Y5V multilayer ceramic capacitors based on BaTiO3

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Abstract

The Y5V-1206 base-metal electrode (BME) multilayer ceramic capacitor (MLCC) chips have been characterised for crystalline phases using X-ray diffractometry (XRD), and microstructure using optical microscopy (OM), scanning electron microscopy (SEM) and transmission electron microscopy (TEM). The microstructure features found in the Ni electrode and the BaTiO3 dielectric layer are discussed in terms of the tensile backstresses induced upon firing due to constrained sintering heterogeneously. The chemical compositions containing BaO-excess and additives CaO and ZrO2, determined for BaTiO3 grains by energy-dispersive spectroscopy (EDS) equipped in the TEM are also reported. However, no rare-earth oxides were found in the grains. The representative microstructure of BaTiO3 grains containing dislocations is the “solid-solution” type distinctive from the “core-shell” of the X7R compositions. The fact that no ferroelectric domains were detected suggests that the BaTiO3 grains are pseudo-cubic with the c/a ratio ≈ 1.0.

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Acknowledgement

Thanks are due to the National Science Council of Taiwan for funding through contracts NSC 88-2216-E-110-009, 89-2216-E-110-037, 90-2216-E-110-018, 91-2216-E-110-017, 91-2216-E-110-018, and 92-2216-E-110-003.

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Authors and Affiliations

  1. Centre for Nanoscience, Institute of Materials Science and Engineering, National Sun Yat-Sen University, Kaohsiung, 80424, Taiwan

    Yu-Chuan Wu, Jheng-Syun Lee & Hong-Yang Lu

  2. R&D Technology Centre, Yageo Corporation Nan-Tze Branch, Kaohsiung, 811, Taiwan

    Ching-Li Hu

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  1. Yu-Chuan Wu
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  2. Jheng-Syun Lee
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  3. Hong-Yang Lu
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  4. Ching-Li Hu
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Correspondence to Hong-Yang Lu.

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Wu, YC., Lee, JS., Lu, HY. et al. Microstructure analysis of the Y5V multilayer ceramic capacitors based on BaTiO3 . J Electroceram 18, 13–24 (2007). https://doi.org/10.1007/s10832-007-9003-z

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