Abstract
Thick BST films have been fabricated by a tape casting and firing method. Dielectric constants of BST films are changed from 5700 to 7000 at 1 MHz after focused beam annealing. Furthermore, surface morphologies and depth profile of chemistry have been altered after annealing. Especially, Sr atoms diffuse out to the surface, while Ba atoms diffuse into the center. The possibility of the surface alteration of the thick films have been clearly demonstrated in this study, which may applied for the integration of ferroelectrics and other dielectrics and/or conductors for low cost microwave tunable devices.
Similar content being viewed by others
References
W.J. Kim, W. Chang, S.B. Qadri, J.M. Pond, S.W. Kirchoefer, D.B. Chrisey, and J.S. Horwitz, Appl. Phys. Lett., 76, 1185 (2000).
F.W. Van Keuls, C.H. Mueller, F.A. Miranda, R.R. Romanofsky, C.L. Canedy, S. Aggarwal, T. Venkatesan, R. Ramesh, J.S. Horwitz, W. Chang, and W.J. Kim, IEEE MTT-S 2, 737 (1999).
C.M. Carlson, T.V. Rivkin, P.A. Parilla, J.D. Perkins, D.S. Ginley, A.B. Kozyrev, V. N. Oshadchy, and A.S. Pavlov, Appl. Phys. Lett., 76, 1920 (2000).
C.L. Canedy, S. Aggarwal, H. Li, T. Venkatesan, R. Ramesh, F.W. Van Keuls, R.R. Romanofsky, and F.A. Miranda, Appl. Phys. Lett., 77, 1523 (2000).
J. Im, O. Auciello, P.K. Baumann, S.K. Streiffer, D.Y. Kaufman, and A.R. Krauss, Appl. Phys. Lett., 76, 625 (2000).
E.G. Erker, A.S. Nagra, Y. Liu, P. Periaswamy, T.R. Taylor, J. Speck, and R.A. York, IEEE Micro. Guided Wave Lett., 10, 10 (2000).
B.H. Park, E.J. Peterson, Q.X. Jia, J. Lee, X. Zeng, W. Si, and X.X. Xi, Appl. Phys. Lett., 78, 533 (2001).
W.J. Kim, W. Chang, S.B. Qadri, J.M. Pond, S.W. Kirchoefer, J.S. Horwitz, and D.B. Chrisey, Appl. Phys. A, 70, 313 (2000).
K. Kageyama, and J. Takahashi, J. Am. Ceram. Soc., 87(8), 1602 (2004).
L. Laudebat, V. Bley, T. Lebey, H. Schneider, and P. Tounsi, Eur. Phys. J. Appl. Phys., 14, 107 (2001).
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
About this article
Cite this article
Kim, S.S., Chung, JK., Kim, IS. et al. Dielectric properties of ferroelectric (Ba0.6Sr0.4)TiO3 thick films prepared by tape-casting. J Electroceram 17, 451–454 (2006). https://doi.org/10.1007/s10832-006-9765-8
Received:
Revised:
Accepted:
Issue Date:
DOI: https://doi.org/10.1007/s10832-006-9765-8