Abstract
Hysteresis in industrial platinum resistance thermometers (IPRT) is caused by tension and compression induced in the wire due to differential thermal expansion of the platinum wire and the substrate. This article reports the measurement of hysteresis in a wide range of IPRTs including thin-film, glass-encapsulated, ceramic-encapsulated, and low-hysteresis partially-supported sensors, over the temperature range from −20 °C to 180 °C. The study confirms previous findings that the amount of hysteresis is very dependent on the design of the sensing element and the temperature range. In addition, some sensors exhibit a large change in resistance on first use, whereas others showed a slow increase in resistance with use. The observed hysteresis ranged between 0.2 % of the temperature range for one glass-encapsulated sensor and 0.002 % for the best of the partially-supported ceramic sensors.
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References
D.J. Curtis, in Temperature Its Measurement and Control in Science and Industry, vol. 5, ed. by J.F. Schooley (AIP, New York, 1982), pp. 803–812
Nicholas J.V., White D.R.: Traceable Temperatures, 2nd edn. Wiley, Chichester (2001)
Murdock W.E., Strouse G.F.: NCSLI Meas. 5, 28 (2009)
British Standards Institute, BS EN60751:2008, IPRTs and Platinum Temperature Sensors (CENLEC, Brussels, 2009)
American Society for Testing and Materials, E644-04, Standard Test Methods for Testing IPRTs (ASTM, West Conshohocken, PA, 2005)
International Organization for Standardization, Guide to the Expression of Uncertainty in Measurement (ISO, Genève, Switzerland, 2005)
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White, D.R., Jongenelen, C.L. & Saunders, P. The Hysteresis Characteristics of Some Industrial PRTs. Int J Thermophys 31, 1676–1684 (2010). https://doi.org/10.1007/s10765-010-0821-x
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DOI: https://doi.org/10.1007/s10765-010-0821-x