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Evaluation of a multi-parent advanced generation inter-cross (MAGIC) introgressed line population for Verticillium wilt resistance in Upland cotton

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Abstract

Verticillium wilt (VW, caused by Verticillium dahliae Kleb) is a destructive fungal soil-borne disease in Upland cotton (Gossypium hirsutum L.). High levels of VW resistance can be transferred into Upland from Pima cotton (G. barbadense L.) through interspecific introgression breeding. In this greenhouse study, VW resistance was evaluated in a multi-parent advanced generation inter-cross (MAGIC) introgressed line (IL) population, derived from a random mated Barbadense Upland population with five generations of intermating (called RMBUP-C4) between three Upland cotton cultivars and 18 CS-B Upland lines each carrying a pair of G. barbadense chromosome or arm in the TM-1 background. The objectives of this study were to, (1) evaluate VW resistance of 530 MAGIC ILs in the greenhouse; and (2) to identify lines with VW resistance in the MAGIC population based on a total of three replicated greenhouse tests. Approximately 8 plants for each line in each replicate were grown and screened for VW resistance using three parameters i.e., disease leaf severity rating, percentage defoliated leaves, and percentage infected plants, with a total of ~ 25,190 plants evaluated. A correlation analysis indicated that the three parameters were significantly and positively correlated with one another in each test. The disease leaf severity rating was the best parameter to assess VW resistance due to its relatively low coefficient of variation and its higher resolution to differentiate resistant genotypes from susceptible ones. Of the 530 genotypes, 5 showed resistance to VW, namely, NMIL348, NMIL518, NMIL405, NMIL290, NMIL307 and had higher levels of resistance to VW with mean disease leaf severity ratings, percentage of defoliated leaves, and percentage of infected plants across three tests ranging from 0.58–1.46, 9.46–26.74, and 25–95%, respectively. These lines can be used as parental lines to improve VW resistance in cotton breeding programs.

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Author notes

  1. Gasper Martinez

    Present address: Agricultural Science Center at Tucumcari, New Mexico State University, 6502 Quay Road AM.5, Tucumcari, NM, 88401, USA

Authors and Affiliations

  1. Department of Plant and Environmental Sciences, New Mexico State University, Box 30003, Las Cruces, NM, 88003, USA

    Gasper Martinez, Abdelraheem Abdelraheem & Jinfa Zhang

  2. Agricultural Science Center, New Mexico State University, Tucumcari, NM, 88401, USA

    Murali Darapuneni

  3. Genetics and Sustainable Agriculture Research, USDA-ARS, Mississippi State, MS, 39762, USA

    J. N. Jenkins & J. C. McCarty Jr.

Authors
  1. Gasper Martinez
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  2. Abdelraheem Abdelraheem
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  3. Murali Darapuneni
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  4. J. N. Jenkins
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  5. J. C. McCarty Jr.
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  6. Jinfa Zhang
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Correspondence to Jinfa Zhang.

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Martinez, G., Abdelraheem, A., Darapuneni, M. et al. Evaluation of a multi-parent advanced generation inter-cross (MAGIC) introgressed line population for Verticillium wilt resistance in Upland cotton. Euphytica 214, 197 (2018). https://doi.org/10.1007/s10681-018-2278-0

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  • DOI: https://doi.org/10.1007/s10681-018-2278-0

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