Abstract
This paper presents a novel comparator being robust to temperature and process variations. The new comparator is confronted to a conventional topology used in most of the Successive Approximations Analog to Digital Converters (SAR ADCs) for biomedical applications. To verify the benefits of the new comparator, it was designed on a CMOS 65 nm process and characterized with post layout simulations under conditions of process and temperature fluctuations. With the proposed circuit, a SAR ADC exhibits 83.11 dB of Signal to Noise Ratio at 1.28 MS/s and \(375\,\upmu\hbox {W}\) of power consumption. The PT variations for critical corners are less than 0.58 bits.
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Acknowledgements
The authors give special thanks to CONACyT Mexico for the financial support of the Project Infra 2013 \(\# 205873\).
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de La Fuente-Cortes, G., Espinosa Flores-Verdad, G., Gonzalez-Diaz, V.R. et al. A new CMOS comparator robust to process and temperature variations for SAR ADC converters. Analog Integr Circ Sig Process 90, 301–308 (2017). https://doi.org/10.1007/s10470-016-0916-9
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DOI: https://doi.org/10.1007/s10470-016-0916-9