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Electro-optic modulation analysis of a Y-cut Z-propagation LiNbO3 light modulator: Comparison with an X-cut Z-propagation LiNbO3 light modulator and a dual LiNbO3 crystal type modulator

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Abstract

We analyzed dependence of modulation characteristics on manufacturing errors for a Y-cut Z-propagation (YZ) and an X-cut Z-propagation (XZ) LiNbO3 (LN) crystal light modulators. We investigated that the modulation of the YZ modulator is hardly affected by small rotation error of Z-axis, while the XZ modulator suffers significant influence. We also analyzed temperature characteristics of modulation of conventional temperature-compensation LN light modulator. These numerical results show that the modulated signal change of the YZ modulator due to temperature variance is not more than 2.5% of that of the temperature-compensation modulator, in the presence of applied electric field of integral times of the half-wave voltage, modulated signal of the YZ modulator is almost independent on the temperature.

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Authors and Affiliations

  1. Department of Materials and Life Science, Faculty of Science and Technology, Seikei University, Musashino, Tokyo, 180-8633, Japan

    Kuniharu Takizawa

  2. Department of Mechanical Systems Engineering, Interdisciplinary Graduate School of Medicine and Engineering, University of Yamanashi, Kofu, 400-8511, Japan

    Lianhua Jin

Authors
  1. Kuniharu Takizawa
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  2. Lianhua Jin
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Correspondence to Kuniharu Takizawa.

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Takizawa, K., Jin, L. Electro-optic modulation analysis of a Y-cut Z-propagation LiNbO3 light modulator: Comparison with an X-cut Z-propagation LiNbO3 light modulator and a dual LiNbO3 crystal type modulator. OPT REV 18, 203–211 (2011). https://doi.org/10.1007/s10043-011-0043-x

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  • DOI: https://doi.org/10.1007/s10043-011-0043-x

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