Simultaneous Measurement of Refractive Index and Thickness by Low Coherence Interferometry Considering Chromatic Dispersion of Index

Abstract

Low coherence interferometry can provide simultaneous measurement of refractive index n and thickness t of a transparent plate, as reported recently by some research groups. Precise measurement of n and t is impossible unless chromatic dispersion of index is taken into account. We then proposed and demonstrated a unique technique for simultaneous measurement of phase index n_p, group index n_g and thickness t using a special sample holder. This paper describes a novel technique for simultaneous measurement of n_p, n_g and t using an approximate expression of the chromatic dispersion in terms of n_p. The approximate expression of chromatic dispersion does not require use of the special sample holder, and n_p, n_g and t are determined from two measurable quantities with an accuracy of 0.3% or less, for the sample thickness was around 1 mm. In addition, it is possible to shorten the measurement time compared with the above method.