Abstract
In this paper, the major source of phase error for multi-bit MEMS distributed phase shifters, the mismatch between adjacent bits, is investigated. A quantitative account of the phase deviation with the effect of mismatch considered is presented by the simulated results as well as theoretically calculated results. A novel multi-bit distributed MEMS phase shifter aimed to eliminate this error source is proposed. The basic concept for the structure is that, by controlling the phase shifter from the unit cell level, performance deterioration resulted from multiple reflection of the signal in the device in the phase state switching process is avoided. To verify the feasibility of the proposed structure, two X-band 5-bit distributed phase shifters are designed and simulated. Compared with the traditional structure, the average phase errors in all phase states of the two are improved by 28.22 and 36.52 % at 10 GHz. The average RMS phase errors in the bandwidth of 1–12-GHz of 56 frequency points are 1.23° and 1.85°. The improvements of the return loss and insertion loss are also exhibited. Furthermore, the aperiodic distributed phase shifter using different unit cells is introduced to demonstrate that the proposed structure can also be used to decrease the number of MEMS switches of multi-bit MEMS distributed phase shifters.
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Abbreviations
- RF MEMS:
-
Radio frequency micro-electromechanical system
- MAM:
-
Metal–air–metal
- DMTL:
-
Distributed MEMS transmission line
- DC:
-
Direct current
- RMS:
-
Root mean square
- CPW:
-
Coplanar waveguide
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Acknowledgments
This work was supported by the National Natural Science Foundation of China and the China Academy of Engineering Physics (11176006), the Foundation of China (Grant No. 9140A23060409DZ02) and Chinese Academy of Engineering Physics Science and Technology Development Foundation (Grant No. 2008A0403016).
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Du, Y.J., Bao, J.F. & Jiang, J.W. A new design of multi-bit RF MEMS distributed phase shifters for phase error reduction. Microsyst Technol 19, 237–244 (2013). https://doi.org/10.1007/s00542-012-1649-z
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DOI: https://doi.org/10.1007/s00542-012-1649-z