Skip to main content
SpringerLink
Log in

Full-field refractive index measurement using absolute-phase total internal reflection heterodyne interferometry

  • Regular Paper
  • Published:
Applied Physics B Aims and scope Submit manuscript

Abstract

In this paper, absolute-phase total internal reflection heterodyne interferometry is proposed for measuring a full-field refractive index. In this method, an optical configuration of prism-based total internal reflection is used. If an electro-optical modulator is driven by a sawtooth wave with an amplitude lower than the half-wave voltage, heterodyne interferometric signals can be generated in segment mode. After a camera has captured these discrete interferometric signals, the optimum signal segment can be analyzed; a specific time segment can be inserted so that the interferometric signals of every pixel can be fitted as a continuous sinusoidal wave; a least-squares sine-fitting algorithm can extract the initial phase. Finally, the absolute phase can be calculated by subtraction of the characteristic phase, and the full-field refractive index can be obtained. To prove the feasibility of the proposed method, the different combinations of specimens were measured, including air, water, glycerol, and castor oil. The experimental data correspond well with the theoretical values. This method features simple operation, low influence of environmental disturbance, rapid measurement, and high resolution.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Fig. 1
Fig. 2
Fig. 3
Fig. 4
Fig. 5
Fig. 6
Fig. 7
Fig. 8

Similar content being viewed by others

References

  1. Y.M. Nimdeo, Y.M. Joshi, K. Muralidhar, Appl. Clay Sci. 123, 272 (2016)

    Article  Google Scholar 

  2. P.Y. Liu, L.K. Chin, W. Ser, H.F. Chen, C.M. Hsieh, C.H. Lee, K.B. Sung, T.C. Ayi, P.H. Yap, B. Liedberg, K. Wang, T. Bourouina, Y. Leprince-Wang, Lab Chip 16, 634 (2016)

    Article  Google Scholar 

  3. B.H. Lee, N.H. Shin, K. Jeong, M.J. Park, B.G. Kim, J.H. Yoo, D.G. Kim, K.H. Yun, K.S. Lee, K.H. Kim, D.K. Kim, S.H. Park, J. Opt. Soc. Korea 13, 468 (2009)

    Article  Google Scholar 

  4. N.H. Fontaine, M. Young, Appl. Opt. 38, 6836 (1999)

    Article  ADS  Google Scholar 

  5. W.J. Choi, D.I. Jeon, S.G. Ahn, J.H. Yoon, S. Kim, B.H. Lee, Opt. Express 18, 23285 (2010)

    Article  ADS  Google Scholar 

  6. H.G. Tompkins, A. Eugene, Handbook of ellipsometry (William Andrew Publishing, Springer, Irene, 2005)

    Book  Google Scholar 

  7. Y.S. Lin, M.H. Chiu, Appl. Mech. Mater. 870, 9 (2017)

    Article  Google Scholar 

  8. Z.C. Jian, P.J. Hsieh, H.C. Hsieh, H.W. Chen, D.C. Su, Opt. Commun. 268, 23 (2006)

    Article  ADS  Google Scholar 

  9. J.Y. Lee, T.K. Chou, H.C. Shih, Opt. Lett. 33, 434 (2008)

    Article  ADS  Google Scholar 

  10. C.L. Wong, H.P. Ho, T.T. Yu, Y.K. Suen, W.W. Chow, S.Y. Wu, W.C. Law, W. Yuan, W.J. Li, S.K. Kong, C. Lin, Appl. Opt. 46, 2325 (2007)

    Article  ADS  Google Scholar 

  11. J. Zhang, J. Di, Y. Li, T. Xi, J. Zhao, Opt. Express 23, 27328 (2015)

    Article  ADS  Google Scholar 

  12. M. Akiba, K.P. Chen, N. Tanno, Opt. Lett. 28, 816 (2003)

    Article  ADS  Google Scholar 

  13. IEEE, “Standard for terminology and test methods for Analog to Digital converters,” IEEE Std. 1241-2000, 25-29 (2000)

  14. Y.L. Chen, D.C. Su, Appl. Opt. 47, 6518 (2008)

    Article  ADS  Google Scholar 

  15. Z.C. Jian, Y.L. Chen, H.C. Hsieh, P.J. Hsieh, D.C. Su, Opt. Eng. 46, 115604-1 (2007)

    Article  ADS  Google Scholar 

  16. M.H. Chiu, J.Y. Lee, D.C. Su, Appl. Opt. 38, 4047 (1999)

    Article  ADS  Google Scholar 

Download references

Acknowledgements

The authors would like to thank the National Science Council of the Republic of China, Taiwan for financially supporting this research under Contract No. MOST 107-2221-E-035-068-MY2.

Author information

Authors and Affiliations

  1. Department of Electrical Engineering, Feng Chia University, No. 100, Wenhwa Road, Seatwen, Taichung, 40724, Taiwan, ROC

    Kun-Huang Chen & Yung-Hua Wang

  2. Department of Photonics, Feng Chia University, No. 100, Wenhwa Road, Seatwen, Taichung, 40724, Taiwan, ROC

    Jing-Heng Chen

  3. Program of Electrical and Communications Engineering, Feng Chia University, No. 100, Wenhwa Road, Seatwen, Taichung, 40724, Taiwan, ROC

    Chih-Hsiung Lin

Authors
  1. Kun-Huang Chen
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. Yung-Hua Wang
    View author publications

    You can also search for this author in PubMed Google Scholar

  3. Jing-Heng Chen
    View author publications

    You can also search for this author in PubMed Google Scholar

  4. Chih-Hsiung Lin
    View author publications

    You can also search for this author in PubMed Google Scholar

Corresponding author

Correspondence to Kun-Huang Chen.

Additional information

Communicated by Dieter Meschede.

Publisher's Note

Springer Nature remains neutral with regard to jurisdictional claims in published maps and institutional affiliations.

Rights and permissions

Reprints and permissions

About this article

Check for updates. Verify currency and authenticity via CrossMark

Cite this article

Chen, KH., Wang, YH., Chen, JH. et al. Full-field refractive index measurement using absolute-phase total internal reflection heterodyne interferometry. Appl. Phys. B 126, 109 (2020). https://doi.org/10.1007/s00340-020-07462-z

Download citation

  • Received:

  • Accepted:

  • Published:

  • DOI: https://doi.org/10.1007/s00340-020-07462-z

Search

Navigation