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Surface excitations in thin helium films on silica aerogel

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Abstract.

First measurements are reported on pure surface excitations in thin superfluid 4He films on silica aerogel. The ripplon dispersion curve is found to be the same for helium on graphite and silica aerogel substrates. However, the layered roton line width in helium films on aerogel shows a pronounced broadening with respect to that found in helium films on graphite.

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Authors and Affiliations

  1. Institut Laue Langevin, B.P.156, 38042, Grenoble Cedex 9, France, , , , , , FR

    H.J. Lauter

  2. Institute for Physics and Power Engineering, 249020, Bondarenko sq.1, Obninsk, Russia, , , , , , RU

    I.V. Bogoyavlenskii, A.V. Puchkov & A. Skomorokhov

  3. CNRS-CRTBT, 38042 Grenoble Cedex 9, France, , , , , , FR

    H. Godfrin

  4. Fachbereich Physik, Universität Konstanz, 78434 Konstanz, Germany, , , , , , DE

    J. Klier & P. Leiderer

Authors
  1. H.J. Lauter
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  2. I.V. Bogoyavlenskii
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  3. A.V. Puchkov
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  4. H. Godfrin
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  5. A. Skomorokhov
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  6. J. Klier
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  7. P. Leiderer
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Additional information

Received: 27 July 2001 / Accepted: 11 December 2001

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ID="*"Corresponding author. (Fax: +33-476/207120, E-mail: lauter@ill.fr)

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Lauter, H., Bogoyavlenskii, I., Puchkov, A. et al. Surface excitations in thin helium films on silica aerogel . Appl Phys A 74 (Suppl 1), s1547–s1549 (2002). https://doi.org/10.1007/s003390201774

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  • DOI: https://doi.org/10.1007/s003390201774

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