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Received: 25 July 1997/Accepted: 1 October 1997
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Kühle, A., Sorensen, A., Zandbergen, J. et al. Contrast artifacts in tapping tip atomic force microscopy . Appl Phys A 66 (Suppl 1), S329–S332 (1998). https://doi.org/10.1007/s003390051156
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DOI: https://doi.org/10.1007/s003390051156