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Low temperature force microscopy based on piezoresistive cantilevers operating at a higher flexural mode

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or 3rd) mechanical resonances (>0.4 MHz) allows to improve the signal-to-noise ratio by a factor of 3. This offers the possibility to considerably reduce the heat dissipation during the measurements. Our detection method is particularly advantageous for studying superconductor surfaces. Measurements illustrating the sensitivity and imaging capability of our new detection method are presented.

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Authors and Affiliations

  1. Laboratorium voor Vaste-Stoffysica en Magnetisme, Katholieke Universiteit Leuven, Celestijnenlaan 200 D, B-3001 Leuven, Belgium, , , , , , BE

    A. Volodin & C. Van Haesendonck

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  1. A. Volodin
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  2. C. Van Haesendonck
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Received: 25 July 1997/Accepted: 1 October 1997

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Volodin, A., Van Haesendonck, C. Low temperature force microscopy based on piezoresistive cantilevers operating at a higher flexural mode . Appl Phys A 66 (Suppl 1), S305–S308 (1998). https://doi.org/10.1007/s003390051151

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  • DOI: https://doi.org/10.1007/s003390051151

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