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Structural, electrical, and impedance properties of Co and Sn doped Ba0.5Sr0.5Fe12-2xO19 hexaferrite ceramics (0 ≤ x ≤ 1) and their evaluation for antenna application

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Abstract

The effect of doping of Co2+ and Sn4+ in Ba0.5Sr0.5Fe12-2xO19 hexaferrite with different concentrations (x = 0.2, 0.4, 0.6, 0.8, and 1.0) was studied by X-ray diffraction (XRD), Scanning Electron Microscopy (SEM), complex impedance spectroscopy, and analyzed as a dielectric resonating antenna (DRA) at room temperature. The samples were produced and sintered by the solid-state reaction method. Their structure appeared from the M-phase type while their increase in grain size evidenced a dependency on Co-Sn content. The dielectric constant and loss tangent, inferred from impedance spectroscopy, also decreased with the corresponding increase in doping. The real and imaginary impedance decreased with the frequency increment. An electrical equivalent circuit using the Resistance-Constant Phase Element (R-CPE) association was thus proposed, the best-simulated components fitting with the observed structural and microstructure properties. It enabled a better understanding of the microstructure through simulated values of grain/grain boundaries and its effect on tuning the electrical properties in the low-frequency regime. The ferrite characteristics were tested for dielectric resonator antenna applications owing to their good inherent behavior than microstrip patch antenna. Measurement of the radiation efficiency, gain and bandwidth parameters of all the produced ceramics showed that the non-doped one (x = 0.0) exhibits the optimum values: 99.91%, 4.24, and 2.89 GHz, respectively, making the most valuable for antenna applications.

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Funding

The authors are grateful to CNPq (402045/2013-0), the US Air Force Office of Scientific Research (AFOSR) (FA9550-16-1-0127), and CNPq (Process: 402561/2007-4, Edital MCT/CNPq no. 10/2007) for providing financial support.

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Authors and Affiliations

  1. School of Electronics and Electrical Engineering, Lovely Professional University, Phagwara, 144411, India

    Charanjeet Singh

  2. Department of Electronics and Communication Engineering, Yadavindra Department of Engineering, Punjabi University Guru Kashi Campus, Talwandi Sabo, Punjab, India

    Jasbir Singh

  3. Telecommunication Engineering Department, Federal University of Ceara (UFC), P.O. Box 6007, Fortaleza, Ceará, 60755-640, Brazil

    J. E. V. de Morais

  4. Physics Department - Telecommunication, Science and Engineering of Materials Laboratory (LOCEM), Federal University of Ceara (UFC), P.O. Box 6030, Fortaleza, Ceara, 60455-760, Brazil

    J. E. V. de Morais, R. G. M. Oliveira, F. F. Do Carmo, M. A. S. Silva & A. S. B. Sombra

  5. Université Paris Cité, CNRS, ITODYS, 75013, Paris, France

    Souad Ammar-Merah

  6. Adesh Institute of Technology, Ludhiana-Chandigarh Road, Mohali, Gharuan, Punjab, India

    Rajat Joshi

  7. Electronic Materials Research Laboratory & Multifunctional Materials and Structures, Key Laboratory of the Ministry of Education & International Center for Dielectric Research, School of Electronic Science and Engineering, 710049, China, Xi’an Jiaotong University, Shaanxi, Xi’an, 710049, China

    Di Zhou

  8. National University of Science and Technology “MISiS”, Leninskii av., 4, Moscow, 4119049, Russia

    Sergei Trukhanov, Larissa Panina & Alex Trukhanov

  9. South Ural State University, Lenin av., 76, Chelyabinsk, 454080, Russia

    Sergei Trukhanov & Alex Trukhanov

  10. Scientific and Practical Materials Research Center of the NAS of Belarus, P. Brovki str., 19, 220072, Minsk, Belarus

    Sergei Trukhanov & Alex Trukhanov

  11. Institute of Physics, Mathematics and IT, Immanuel Kant Baltic Federal University, A. Nevskiy str., 14, Kaliningrad, 236041, Russia

    Larissa Panina

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Contributions

CS: conceptualization, methodology, investigation, writing original draft. JS: preparation of samples, data curation. JEVM: writing original draft, software simulation, low-frequency measurement. RGMO, FFDC, MASS: antenna measurement. ASBS: methodology, investigation, writing original draft. SA-M: structure characterization, reviewing and editing. RJ: reviewing and editing, data curation. DZ: validation, data curation reviewing and editing. ST, LP, AT: reviewing and editing.

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Correspondence to Charanjeet Singh, Jasbir Singh, J. E. V. de Morais or A. S. B. Sombra.

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Singh, C., Singh, J., de Morais, J.E.V. et al. Structural, electrical, and impedance properties of Co and Sn doped Ba0.5Sr0.5Fe12-2xO19 hexaferrite ceramics (0 ≤ x ≤ 1) and their evaluation for antenna application. Appl. Phys. A 129, 550 (2023). https://doi.org/10.1007/s00339-023-06819-3

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