Abstract
The existence of conducting islands in polyaniline films has long been proposed in the literature, which would be consistent with conducting mechanisms based on hopping. Obtaining direct evidence of conducting islands, however, is not straightforward. In this paper, conducting islands were visualized in poly(o-ethoxyaniline) (POEA) films prepared at low pH, using Transmission Electron Microscopy (TEM) and atomic force spectroscopy (AFS). The size of the islands varied between 67 and 470 Å for a pH=3.0, with a larger average being obtained with AFS, probably due to the finite size effect of the atomic force microscopy tip. In AFS, the conducting islands were denoted by regions with repulsive forces due to the double-layer forces. On the basis of X-ray diffraction (XRD) patterns for POEA in the powder form, we infer that the conducting islands are crystalline, and therefore a POEA film is believed to consist of conducting islands dispersed in an insulating, amorphous matrix. From conductivity measurements we inferred the charge transport to be governed by a typical quasi-one dimensional variable range hopping (VRH) mechanism.
Similar content being viewed by others
References
Y. Yang, A.J. Heeger, Nature 372, 344 (1994)
K. Lee, S. Cho, S.H. Park, A.J. Heeger, C.-W. Lee, S.-H. Lee, Langmuir 441, 65 (2006)
A.L. Kon’kin, V.G. Shtyrlin, R.R. Garipov, A.V. Aganov, A.V. Zkharov, Phys. Rev. B 66, 75203 (2002)
Y. Wei, R. Hariharan, S.A. Patel, Macromolecules 23, 758 (1990)
R.M. Faria, L.H.C. Mattoso, M. Ferreira, O.N. Oliveira, Jr., D. Gonçalves, L.O.S. Bulhões, Thin Solid Films 221, 5 (1992)
P.A. Ribeiro, R. Steitz, I.E. Lopis, H. Haas, N.C. Souza, O.N. Oliveira, Jr., M. Raposo, J. Nanosci. Nanotechnol. 6, 1396 (2006)
J.P. Pouget, S.L. Zhao, Z.H. Wang, Z. Oblakowski, A.J. Epstein, S.K. Manohar, J.M. Wiesinger, A.G. MacDiarmid, C.H. Hsu, Synth. Met. 55, 341 (1993)
N. Consolin, F.L. Leite, E.R. Carvalho, E.C. Venancio, C.M.R. Vaz, L.H.C. Mattoso, J. Braz. Chem. Soc. 18, 577 (2007)
V.N. Prigodin, A.J. Epstein, Physica B 338, 310 (2003)
L.-P. Zhou, B. Liu, Z.-Ya. Li, Phys. Lett. A 333, 322 (2004)
H.C.F. Martens, J.A. Reedijk, H.B. Brom, D.M. de Leeuw, R. Menon, Phys. Rev. B 63, 073203 (2001)
D. Jeon, J. Kim, M.C. Gallagher, R.F. Willis, Science 256, 5064 (1992)
J.P. Pouget, M.E. Josefowicz, A.J. Epstein, X. Tang, A.G. MacDiarmid, Macromolecules 24, 779 (1991)
R.F. Bianchi, G.F.L. Ferreira, C.M. Lepienski, R.M. Faria, J. Chem. Phys. 110, 4602 (1999)
L.H.C. Mattoso, S.K. Manobar, A.G. MacDiarmid, A.J. Epstein, J. Polym. Sci. A 33, 122 (1995)
F.L. Leite, L.G. Paterno, C.E. Borato, P.S.P. Herrmann, O.N. Oliveira, Jr., L.H.C. Mattoso, Polymer 46, 12503 (2005)
J. Rodrıguez-Caravajal, Version 2005 FullProf Program. Rietveld, Profile Matching and Integrated Intensities Refinement of X-ray and/or Neutron Data (powder and/or single-crystal) (Laboratoire Leon Brillouin (CEA-CNRS))
P. Thompson, D. Cox, J. Hastings, J. Appl. Crystallogr. 20, 79 (1987)
T. Roisnel, J. Rodriguez-Carvajal, in Materials Science Forum, Proceedings of the Seventh European Powder Diffraction Conference (EPDIC 7), ed. by E.R. Delhez, E. Mittenmeijer, pp. 118–123 (2000)
F.L. Leite, P.S.P. Herrmann, A.L. Da Roz, F.C. Ferreira, A.A.S. Curvelo, L.H.C. Mattoso, J. Nanosci. Nanotechnol. 6, 2354 (2006)
R.M. Faria, R.F. Bianchi, D.T. Balogh, R.J. Ramos, IEEE Trans. Dielectr. Electr. Insul. (EUA) 7, 855 (2000)
R. Pelster, G. Nimtz, B. Wessling, Phys. Rev. B 49, 12718 (1994)
F. Lux, G. Hinrichsen, V.I. Krinichnyi, I.B. Nazarova, S.D. Cheremisow, M.M. Pohl, Synth. Met. 55, 347 (1993)
F. Lux, G. Hinrichsen, M.M. Pohl, J. Appl. Polym. Sci. 32, 1957 (1994)
A.J. Epstein, A.G. MacDiarmid, J.P. Pouget, Phys. Rev. Lett. 65, 664 (1990)
V.N. Prigodin, A.N. Samukhin, A.J. Epstein, Synth. Met. 141, 155 (2004)
M. Evain, S. Quillard, B. Corraze, W. Wang, A.G. MacDiarmid, Acta Crystallogr. E 58, 0343 (2002)
J. Joo, S.M. Long, J.P. Pouget, E.J. Oh, A.G. MacDiarmid, A.J. Epstein, Phys. Rev. B 57, 9567 (1998)
F.L. Leite, P.S.P. Herrmann, J. Adhes. Sci. Technol. 19, 365 (2005)
F.L. Leite, C.E. Borato, W.T.L. da Silva, P.S.P. Herrmann, O.N. Oliveira, Jr., L.H.C. Mattoso, Microsc. Microanal. 13, 304 (2007)
H.-J. Butt, Biophys. J. 60, 1438 (1991)
F. Zuo, M. Angelopoulos, A.G. MacDiarmid, A.J. Epstein, Phys. Rev. B 36, 3475 (1987)
D. Jeon, J. Kim, M.C. Gallagher, R.F. Willis, Science 256, 1662 (1992)
Z.H. Wang, C. Li, E.M. Scherr, A.G. MacDiarmid, A.J. Esptein, Phys. Rev. Lett. 66, 1745 (1991)
A. Raghunathan, P.K. Kahol, B.J. McCormick, Solid State Commun. 108, 817 (1998)
E.P. Nakhmedov, V.N. Prigodin, A.N. Samukhin, Sov. Phys. Solid State 31, 368 (1989)
Z.H. Wang, A. Ray, A.G. MacDiarmid, A.J. Epstein, Phys. Rev. B 43, 4373 (1991)
A. Raghunathan, T.S. Natarajan, G. Rangarajan, S.K. Dhawan, D.C. Trivedi, Phys. Rev. B 47, 13189 (1993)
M. Gosh, A.K. Meikap, S.K. Chattopadhyay, S. Chatterjee, J. Phys. Chem. Solids 62, 475 (2001)
A. Raghunathan, P.K. Kahol, B.J. McCormick, Synth. Met. 100, 205 (1999)
G. Zotti, M.C. Gallazzi, G. Zerbi, S.V. Meille, Synth. Met. 73, 217 (1995)
A.B. Kaiser, Rep. Prog. Phys. 64, 1 (2001)
R.S. Kohlman, J. Joo, A.J. Epstein, in Physical Properties of Polymers Hand Book, ed. by J.E. Mark (Am. Inst. Phys., New York, 1996), p. 453
J.S. Nogueira, L.H.C. Mattoso, C.M. Lepienski, R.M. Faria, Synth. Met. 69, 259 (1995)
N.F. Mott, M. Kaveh, Adv. Phys. 34, 329 (1985)
Z.H. Wang, E.M. Scherr, A.G. MacDiarmid, A.J. Epstein, Phys. Rev. B 45, 4190 (1992)
A. Raghunathan, P.K. Kahol, B.J. McCormick, Synth. Met. 101, 732 (1999)
P. Sheng, B. Abeles, Y. Arie, Phys. Rev. Lett. 31, 44 (1973)
V.N. Prigodin, A.J. Epstein, Synth. Met. 125, 43 (2002)
F.L. Leite, M. Oliveira Neto, L.G. Paterno, M.R.M. Ballestero, I. Polikarpov, Y.P. Mascarenhas, P.S.P. Herrmann, L.H.C. Mattoso, O.N. Oliveira, Jr., J. Colloid Interface Sci. 316, 376 (2007)
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
About this article
Cite this article
Leite, F.L., Alves, W.F., Mir, M. et al. TEM, XRD and AFM study of poly(o-ethoxyaniline) films: new evidence for the formation of conducting islands. Appl. Phys. A 93, 537–542 (2008). https://doi.org/10.1007/s00339-008-4686-9
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s00339-008-4686-9