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Lateral resolving power of a time-of-flight photoemission electron microscope

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Abstract

The lateral resolution of a time-of-flight photoemission electron microscope has been theoretically analyzed. It has been shown that the resolution limit can reach a few nanometers. The lateral resolution will be higher if the photoelectrons forming the image are characterized by a smaller acceptance angle obtained with the help of diaphragms in the crossover plane, a higher initial energy and a narrower interval of electron energies. The experimental results are in good agreement with the theoretical predictions.

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Authors and Affiliations

  1. Institute of Physics, University Mainz, Staudingerweg 7, 55099, Mainz, Germany

    S.A. Nepijko, A. Oelsner, A. Krasyuk, A. Gloskovskii & G. Schönhense

  2. Institute of Physics, National Academy of Sciences of Ukraine, pr. Nauki 46, 03650, Kiev, CIS, Ukraine

    S.A. Nepijko

  3. The Moscow Military Institute, Golovachev str., 109380, Moscow, CIS, Russia

    N.N. Sedov

  4. Institute of Solid State and Materials Research Dresden, Helmholzstr. 20, 01069, Dresden, Germany

    C.M. Schneider

Authors
  1. S.A. Nepijko
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  2. A. Oelsner
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  3. A. Krasyuk
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  4. A. Gloskovskii
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  5. N.N. Sedov
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  6. C.M. Schneider
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  7. G. Schönhense
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Correspondence to S.A. Nepijko.

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PACS

68.37.Xy

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Nepijko, S., Oelsner, A., Krasyuk, A. et al. Lateral resolving power of a time-of-flight photoemission electron microscope. Appl. Phys. A 78, 47–51 (2004). https://doi.org/10.1007/s00339-003-2291-5

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  • DOI: https://doi.org/10.1007/s00339-003-2291-5

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