Abstract
An experimental and theoretical study on the nature of the movement of a scanned tip on a graphite surface is presented. A comparison between theory and experiment demonstrates that the lateral forces occurring during scanning are strongly affected by the so-called “stick-slip“ movement of the tip. The experimentally observed force maps are identified to represent “hollow-site resolution“ instead of “atomic resolution“.
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Hölscher, H., Schwarz, U.D., Zwörner, O. et al. Stick-slip movement of a scanned tip on a graphite surface in scanning force microscopy. Zeitschrift für Physik B Condensed Matter 104, 295–297 (1997). https://doi.org/10.1007/s002570050452
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DOI: https://doi.org/10.1007/s002570050452