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Measuring moisture content profiles in a board during drying: a polychromatic X-ray system interfaced with a vacuum/pressure laboratory kiln

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Abstract

A standard X-ray source and an energy-sensitive detector were placed on both sides of a wood dryer which operates over a wide range of drying conditions. The spectrometric X-ray intensities transmitted through the wood sample were related to the mass concentration of wood and water using a rigorous calculation needed in the case of a polychromatic X-ray beam. The source and the detector are carried by a motion controller in order to scan the sample at different drying times and determine the moisture content (MC) profile along the board thickness. Treatment on spectrometric data and the evolution of the MC profiles in a Norway spruce board (Picea abies) are presented in this work.

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Acknowledgements

The authors would like to acknowledge the “French Ministry for Agriculture and Fisheries” for funding one part of this work in the framework of the research project no 61.45.39/01 entitled “Development of drying schedules adapted to large thickness of spruce lumber”.

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Authors and Affiliations

  1. LERMAB (Joint research unit on wood material)- UMR 1093, INRA/ENGREF/UHP ENGREF (School of Forestry), 14, rue Girardet., 54042, Nancy Cedex, France

    Ricardo Baettig, Romain Rémond & Patrick Perré

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  1. Ricardo Baettig
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  2. Romain Rémond
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  3. Patrick Perré
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Correspondence to Patrick Perré.

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Baettig, R., Rémond, R. & Perré, P. Measuring moisture content profiles in a board during drying: a polychromatic X-ray system interfaced with a vacuum/pressure laboratory kiln. Wood Sci Technol 40, 261–274 (2006). https://doi.org/10.1007/s00226-006-0068-7

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  • DOI: https://doi.org/10.1007/s00226-006-0068-7

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