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Quantitative X-ray fluorescence analysis of an Egyptian faience pendant and comparison with PIXE

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Abstract

The X-ray fluorescence (XRF) technique is a common choice in the archaeometric field for in situ investigations with portable instruments. This work shows that XRF portable systems can be used for quantitative analyses using appropriate software, obtaining a similar accuracy to that provided with other techniques such as particle-induced X-ray emission (PIXE), as shown for an Egyptian faience pendant and for two glass standards.

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Acknowledgements

The authors gratefully acknowledge G. Pierrat (Louvre Museum) for providing the studied sample, AGLAE and the C2RMF staffs for their assistance, and the financial support from contract MEC/FECYT 2007 and EU-ARTECH (FP6, Union Européenne, contract RII3-CT-2004-506171).

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Authors and Affiliations

  1. Centre de Recherche et de Restauration des Musées de France, C2RMF, CNRS UMR 171, Palais du Louvre, Porte des Lions, 14 quai François Mitterrand, 75001, Paris, France

    L. de Viguerie, A. Duran, A. Bouquillon, J. Castaing & P. Walter

  2. European Synchrotron Radiation Facility, ESRF, BP 220, 38043, Grenoble, France

    V. A. Solé

Authors
  1. L. de Viguerie
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  2. A. Duran
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  3. A. Bouquillon
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  4. V. A. Solé
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  5. J. Castaing
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  6. P. Walter
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Corresponding author

Correspondence to A. Duran.

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de Viguerie, L., Duran, A., Bouquillon, A. et al. Quantitative X-ray fluorescence analysis of an Egyptian faience pendant and comparison with PIXE. Anal Bioanal Chem 395, 2219–2225 (2009). https://doi.org/10.1007/s00216-009-2974-7

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  • DOI: https://doi.org/10.1007/s00216-009-2974-7

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