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Nanoscale machinability and subsurface damage machined by CMP of soft-brittle CdZnTe crystals

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Abstract

Nanoscale machinability and subsurface damage induced by chemical mechanical polishing of three kinds of single crystals were investigated by nanoscratch and high-resolution transmission electron microscope (HRTEM). When the constant loads increase from 800 μN to 3,200 μN, the friction coefficient adjacently linearly increases from 0.199 to 0.292, due to the surface machining hardening effect. As the slight wiping on the surface of Cd0.9Zn0.1Te (111) leads to microscratches, the surface turns worse, resulting in the decrease and fluctuation of friction coefficient. Shear band appears on the surface of Cd0.96Zn0.04Te (111), while it disappears on the surfaces of Cd0.96Zn0.04Te (110) and Cd0.9Zn0.1Te (111), replacing with more obvious plastic flow pile-up, and showing the better nanoscale machinability. The cross-sectional HRTEM images show that after CMP the damage layer is 2 nm, and only consists of amorphous state, indicating the main material removal mode of chemical dissolving. While after lapping and mechanical polishing, wear track with width of about 50 nm is still left on the machined surface, and subsurface damage layer is about 10 nm.

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References

  1. Zhang ZY, Guo DM, Kang RK, Gao H, Li Y (2008) Chemical mechanical polishing research of CdZnTe functional crystalline with soft brittle nature. Chin J Mech Eng 44(12):215–220 in Chinese

    Article  Google Scholar 

  2. Zhang ZY, Gao H, Jie WQ, Guo DM, Kang RK, Li Y (2008) Chemical mechanical polishing and nanomechanics of semiconductor CdZnTe single crystals. Semicond Sci Technol 23(10):105023

    Article  Google Scholar 

  3. Jeong HD, Park KH, Cho KK (2007) CMP pad break-in time reduction in silicon wafer polishing. CIRP Ann Manuf Technol 56(1):357–360

    Article  Google Scholar 

  4. Zong WJ, Sun T, Li D, Cheng K, Liang YC (2008) XPS analysis of the groove wearing marks on flank face of diamond tool in nanometric cutting of silicon wafer. Int J Mach Tools Manuf 48(15):1678–1687

    Article  Google Scholar 

  5. Yang B, Shen X, Lei S (2009) Mechanisms of edge chipping in laser-assisted milling of silicon nitride ceramics. Int J Mach Tools Manuf 49(3–4):344–350

    Article  Google Scholar 

  6. Agarwal S, Rao PV (2008) Experimental investigation of surface/subsurface damage formation and material removal mechanisms in SiC grinding. Int J Mach Tools Manuf 48(6):698–710

    Google Scholar 

  7. Jirapattarasilp K, Rukijkanpanich J (2007) The experiment of high-speed grinding of a gemstone: cubic zirconia. Int J Adv Manuf Technol 33(11–12):1136–1142

    Article  Google Scholar 

  8. Chen JY, Huang H, Xu XP (2009) An experimental study on the grinding of alumina with a monolayer brazed diamond wheel. Int J Adv Manuf Technol 41(1–2):16–23

    Article  MATH  Google Scholar 

  9. Wang GJ, Wang MT, Yang FC, Huang ML, Loh KN, Chen J (2009) Grey forecasting run-to-run control system in copper chemical mechanical polishing. Int J Adv Manuf Technol 41(1–2):48–56

    Article  Google Scholar 

  10. Lin ZC, Chen ZD, Huang JC (2007) Establishment of a cutting force model and study of the stress-strain distribution in nano-scale copper material orthogonal cutting. Int J Adv Manuf Technol 33(5–6):425–435

    Article  Google Scholar 

  11. Chandrashekar T, Muralidhara MK, Kashyap KT, Rao PR (2009) Effect of growth restricting factor on grain refinement of aluminum alloys. Int J Adv Manuf Technol 40(3–4):234–241

    Article  Google Scholar 

  12. Tsao CC (2009) Grey-Taguchi method to optimize the milling parameters of aluminum alloy. Int J Adv Manuf Technol 40(1–2):41–48

    Article  Google Scholar 

  13. Schlesinger TE, Toney JE, Yoon H, Lee EY, Brunett BA, Franks L, James RB (2001) Cadmium zinc telluride and its use as a nuclear radiation detector material. Mater Sci Eng R Rep 32(4–5):103–189

    Article  Google Scholar 

  14. Vahdati M, Shokuhfar A (2008) A trend toward abrasive nano finishing of plane surfaces with magnetic field energy. Mater wis Werkstofftech 39(2):167–170

    Article  Google Scholar 

  15. Park JW, Lee CM, Choi SC, Kim YW, Lee DW (2008) Surface patterning for brittle amorphous material using nanoindenter-based mechanochemical nanofabrication. Nanotechnology 19(8):085301

    Article  Google Scholar 

  16. Lu YF (2005) Laser-assisted nanoscale material processing. ASME Heat Transf Div Publ HTD 376HTD(2):1025-1034

    Google Scholar 

  17. Li XP, He T, Rahman M (2005) Tool wear characteristics and their effects on nanoscale ductile mode cutting of silicon wafer. Wear 259(Part 2 Sp):1207–1214

    Article  Google Scholar 

  18. Guo DM, Zhang ZY, Kang RK, Gao H (2009) Nanocutting process of CdZnTe single crystals. Mater Manuf Process 24(4):504–508

    Article  Google Scholar 

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Correspondence to Zhenyu Zhang.

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Zhang, Z., Meng, Y., Guo, D. et al. Nanoscale machinability and subsurface damage machined by CMP of soft-brittle CdZnTe crystals. Int J Adv Manuf Technol 47, 1105–1112 (2010). https://doi.org/10.1007/s00170-009-2225-2

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  • DOI: https://doi.org/10.1007/s00170-009-2225-2

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