Abstract
An RC pulse generator can easily generate a pulse on-time as short as a several dozen nanoseconds in micro-electro-discharge machining (micro-EDM), but its discharge frequency is low due to the time needed to charge the capacitor in micro-EDM, which has a strong negative effect on the pulse generator’s working efficiency. Therefore, a new transistor-type isopulse generator has been developed for micro-EDM in this research. Evaluation of the machining characteristics proved that the transistor-type isopulse generator is suitable for micro-EDM. The experimental results reveal that the transistor-type pulse train generator is unsuitable for micro-EDM due to its low removal rate: 80-ns and 30-ns pulse on-times of discharge current can be obtained by using the transistor-type isopulse generator developed in this research, and the removal rate of this generator is two or three times higher than that of the traditional RC pulse generator.
Similar content being viewed by others
References
Matsuhara Y, Obara H et al (2004) Study on high finish machining in wire EDM. J Elec Mach Technol 28(90):19–22
Masuzawa T, Sata T, Kinoshita N (1971) The occurring mechanism of the continuous arc in micro-energy EDM by RC circuit. J JSEME 5(9):35–52
Masuzawa T, Fujino M (1980) Micro pulse for EDM. Proc Japan Society for Precision Engineering Autumn Conference, pp 140–142
He G, Zhao W, Guo Y, Wang Z (1999) Development of nano second order pulse generator. Elec Disch Mach 4:11–13
Masuzawa T, Fujino M, Kobayashi K (1985) Wire electro discharge grinding for micro-machining. Ann CIRP 34(1):431–434
Acknowledgement
The authors wish to express their appreciation to the National 973 Program of China (2003CB716204) for funding this study.
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
About this article
Cite this article
Han, F., Chen, L., Yu, D. et al. Basic study on pulse generator for micro-EDM. Int J Adv Manuf Technol 33, 474–479 (2007). https://doi.org/10.1007/s00170-006-0483-9
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s00170-006-0483-9