Skip to main content
Log in

Research on AOCTPN-based modeling and simulation technology of semiconductor fabrication line

  • Original Article
  • Published:
The International Journal of Advanced Manufacturing Technology Aims and scope Submit manuscript

Abstract

There was a lack of modeling technology for the line fabrication of semiconductors under multi-agent-based scheduling and control status in quo. To resolve this problem, an AOCTPN modeling technology for a semiconductor fabrication line was proposed. The interior behavior of the machine agent was encapsulated and the hierarchical multi-agent-based semiconductor fabrication line model was separated into the system layer, the machine group layer, and the machine agent layer, which reduced the complexity and improved the reuse of the model. In addition, a distributed discrete event simulation platform was built to evaluate the performance of the multi-agent-based semiconductor fabrication line. An illustrative example of a 6-inch semiconductor fabrication line in Shanghai demonstrates the effectiveness of this approach .

This is a preview of subscription content, log in via an institution to check access.

Access this article

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Similar content being viewed by others

References

  1. Uzsoy R, Lee C-Y, Martin-Vega LA (1992) A review of production planning and scheduling models in the semiconductor industry. Part I: system characteristics, performance evaluation and production planning. IIE Trans 24(4):47–60

    Google Scholar 

  2. Uzsoy R, Lee C, Martin-Vega (1994) A review of production planning and scheduling models in the semiconductor industry part II: shop-floor control. IIE Trans 26(5):44–55

    Google Scholar 

  3. Srinivasan RS (1998) Modeling and performance analysis of cluster tools using Petri nets. IEEE Trans Semicond Manuf 11:394–403

    Article  Google Scholar 

  4. Jeng M, Xie X (2001) Modeling and analysis of semiconductor manufacturing systems with degraded behavior using Petri nets and siphons. IEEE Trans Robot Automat 17(5):576–588

    Article  Google Scholar 

  5. Odrey N, Green J, Appello A (2001) A generalized Petri net modeling approach for the control of re-entrant flow semiconductor lot fabrication. Robot Comput Integr Manuf 17:5–11

    Article  Google Scholar 

  6. Wen H, Fu LC, Huang SS(2001) Modeling, scheduling, and prediction in lot fabrication systems using queuing Petri net and genetic algorithm. In: Proc of the 2001 IEEE International Conference on Robotics & Automation. Seoul, Korea, pp 3559–3564

  7. Chen J-H (2001) Petri-net and GA-based approach to modeling, scheduling, and performance evaluation for lot fabrication. IEEE Trans Robot Automat 17(5):619–636

    Article  Google Scholar 

  8. Cavalieri S, Mirabella O (1996) A PN-based scheduler for a flexible semiconductor manufacturing system. In: Proceedings IEEE International Conference Emerging Technology Factory Automation. Kauai, HA, November 18–21, 1996, pp 724–729

  9. Kim, Desrochers AA (1997) Modeling and analysis of semiconductor manufacturing plants using time Petri net models: COT business case study. In: Proceedings IEEE International Conference System Man Cybernetics. Orlando, FL, October 12–15, 1997, pp 3227–3232

  10. Cheng FT, Yang H-C Kuo T-L (2000) Modeling and analysis of equipment managers in manufacturing execution systems for semiconductor packaging. IEEE Trans Syst Man Cybern 30:772–782

    Article  Google Scholar 

  11. MengChu Z, Der JM (1998) Modeling, analysis, simulation, scheduling, and control of semiconductor manufacturing systems: A Petri net approach. IEEE Trans Semicond Manuf 11(3):333–357

    Article  Google Scholar 

  12. Xiong HH, Zhou M (1998) Scheduling of semiconductor test facility via Petri nets and hybrid heuristic search. IEEE Trans Semicond Manuf 11:384–393

    Article  Google Scholar 

  13. Jeng MD, Xie XL, Chou SW (1998) Modeling, qualitative analysis, and performance evaluation of the etching area in an IClot fabrication system using Petri nets. IEEE Trans Semicond Manuf 11:358–373

    Article  Google Scholar 

  14. Jonghun P, Spyros R, Bodner D (2001) High-fidelity rapid prototyping of 300 mm fabs through discrete event system modeling. Comput Ind 45(1):79–98

    Article  Google Scholar 

  15. S. Cavalieri, O. Mirabella, S. Marroccia (1997) Improving flexible semiconductor manufacturing system performance by a colored Petri net based scheduling algorithm. In: Proceedings IEEE International Conference on Emerging Technology Factory Automat. Los Angeles, CA, USA. pp 369–374

  16. Lin S-Y, Huang H-P (1998) Modeling and emulation of a furnace in IC fab based on colored-timed Petri net. IEEE Trans Semicond Manuf 11:410–420

    Article  Google Scholar 

  17. Kuo C-H (2002) Modeling and performance evaluation of an overhead hoist transport system in a 300 mm fabrication plant. Int J Adv Manuf Technol 20:153–161

    Article  Google Scholar 

  18. Lin M-H, Fu L-C (1999) Modeling, analysis, simulation and control of semiconductor manufacturing systems: a generalized stochastic colored timed Petri net approach. In: Proc. IEEE International Conference on Systems, Man, and Cybernetics. Tokyo, Japan, pp 769–774

  19. Kuo, Chung-Hsien, Huang, Han-Pang (2003) Distributed performance evaluation of a controlled IC fab. IEEE Trans Robot Automat 19(6):1027–1033

    Article  Google Scholar 

  20. Jeng MD, Xie XL, Hung WY (2000) Markovian timed Petri nets for performance analysis of semiconductor manufacturing systems. IEEE Trans Syst Man Cybern 30:757–771

    Article  Google Scholar 

Download references

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to Zhai Wenbin.

Rights and permissions

Reprints and permissions

About this article

Cite this article

Wenbin, Z., Xuening, C., Jie, Z. et al. Research on AOCTPN-based modeling and simulation technology of semiconductor fabrication line. Int J Adv Manuf Technol 28, 814–821 (2006). https://doi.org/10.1007/s00170-004-2409-8

Download citation

  • Received:

  • Accepted:

  • Published:

  • Issue Date:

  • DOI: https://doi.org/10.1007/s00170-004-2409-8

Keywords

Navigation