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Correlation between interface modification and rectifying behavior of p-type Cu2ZnSnS4/n-type Si diodes

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Abstract

The effect of surface sulfidation of Si on electronic transport of heterojunction diodes based on the p-type Cu2ZnSnS4 (CZTS) and n-type Si is investigated. The temperature-dependent current–voltage (I–V) characteristics of CZTS/Si diodes with and without sulfide treatment are measured in the temperature range of −30 ~ 90 °C. The temperature dependence of forward bias I–V characteristics can be explained on the basis of the thermionic emission theory. Compared with the CZTS/Si diode without sulfide treatment, the CZTS/Si diode with sulfide treatment exhibits a better rectifying behavior. The enhanced device performance is mainly the result of the formation of Si–S bonds that serve to reduce the interfacial potential fluctuations. In order to obtain a greater understanding of the improved rectifying I–V characteristics, the photoresponse measurement is performed. The increased photocurrent density can be interpreted by the device rectifying performance and interface passivation.

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References

  1. R.A. Ismail, S.M.H. Al-Jawad, N. Hussein, Appl. Phys. A 117, 1977 (2014)

    Article  ADS  Google Scholar 

  2. J.J. Zeng, Y.J. Lin, Appl. Phys. A 116, 581 (2014)

    Article  ADS  Google Scholar 

  3. W.S. Ni, Y.J. Lin, Appl. Phys. A 119, 1127 (2015)

    Article  ADS  Google Scholar 

  4. C.H. Ruan, Y.J. Lin, Y.H. Chen, H.C. Chang, Mater. Sci. Semicond. Process. 32, 62 (2015)

    Article  Google Scholar 

  5. J.H. Lin, J.J. Zeng, Y.J. Lin, Thin Solid Films 550, 582 (2014)

    Article  ADS  Google Scholar 

  6. D. Panda, T.Y. Tseng, Thin Solid Films 531, 1 (2013)

    Article  ADS  Google Scholar 

  7. W.M. Cho, Y.J. Lin, H.C. Chang, Y.H. Chen, Microelectron. Eng. 108, 24 (2013)

    Article  Google Scholar 

  8. S.Y. Myong, L.S. Jeon, S.W. Kwon, Thin Solid Films 550, 705 (2014)

    Article  ADS  Google Scholar 

  9. T. Tayagaki, Y. Hoshi, K. Ooi, T. Kiguchi, N. Usami, Thin Solid Films 557, 368 (2014)

    Article  ADS  Google Scholar 

  10. C.H. Ruan, Y.J. Lin, J. Appl. Phys. 114, 143710 (2013)

    Article  ADS  Google Scholar 

  11. S.C. Chen, T.C. Chang, Y.C. Wu, J.Y. Chin, Y.E. Syu, S.M. Sze, C.Y. Chang, H.H. Wu, Y.C. Chen, Thin Solid Films 518, 3999 (2010)

    Article  ADS  Google Scholar 

  12. C.C. Huang, Y.J. Lin, C.J. Liu, Y.W. Yang, Microelectron. Eng. 110, 21 (2013)

    Article  Google Scholar 

  13. Y.M. Chin, Y.J. Lin, Mater. Chem. Phys. 145, 232 (2014)

    Article  Google Scholar 

  14. X. Li, H. Zhu, K. Wang, A. Cao, J. Wei, C. Li, Y. Jia, Z. Li, X. Li, D. Wu, Adv. Mater. 22, 2743 (2010)

    Article  Google Scholar 

  15. G.R. He, Y.J. Lin, Mater. Chem. Phys. 136, 179 (2012)

    Article  Google Scholar 

  16. B.L. Guo, Y.H. Chen, X.J. Liu, W.C. Liu, A.D. Li, AIP Adv. 4, 097115 (2014)

    Article  ADS  Google Scholar 

  17. S. Gupta, D. Varandani, A.K. Sharma, V.R. Satsangi, B.R. Mehta, Appl. Surf. Sci. 331, 327 (2015)

    Article  ADS  Google Scholar 

  18. C.H. Ruan, C.C. Huang, Y.J. Lin, G.R. He, H.C. Chang, Y.H. Chen, Thin Solid Films 550, 525 (2014)

    Article  ADS  Google Scholar 

  19. S. Tajima, H. Katagiri, K. Jimbo, N. Sugimoto, T. Fukano, Appl. Phys. Express 5, 082302 (2012)

    Article  ADS  Google Scholar 

  20. K. Biswas, S. Lany, A. Zunger, Appl. Phys. Lett. 96, 201902 (2010)

    Article  ADS  Google Scholar 

  21. B. Shin, Y. Zhu, T. Gershon, N.A. Bojarczuk, S. Guha, Thin Solid Films 556, 9 (2014)

    Article  ADS  Google Scholar 

  22. K. Oishi, G. Saito, K. Ebina, M. Nagahashi, K. Jimbo, W.S. Maw, H. Katagiri, M. Yamazaki, H. Araki, A. Takeuchi, Thin Solid Films 517, 1449 (2008)

    Article  ADS  Google Scholar 

  23. G. Turgut, E.F. Keskenler, S. Aydın, S. Doğan, S. Duman, Ş. Özçelik, B. Gürbulak, B. Esen, Phys. Status Solidi A 211, 580 (2014)

    Article  Google Scholar 

  24. L. Li, Y. Wen, Y. Dong, Z. Wang, Q. Liang, Vacuum 49, 45 (2012) (ISSN: 1002-0322). http://tr.oversea.cnki.net/kcms/detail/detail.aspx?QueryID=13&CurRec=21&dbCode=CJFD&filename=ZKZK201205020&dbname=CJFD2012&uid=WEFuTW9CanBIWmtTckhaMw==

  25. F. Yakuphanoglu, Sol. Energy 85, 2518 (2011)

    Article  ADS  Google Scholar 

  26. X. Peng, J. Xu, H. Zang, B. Wang, Z. Wang, J. Luminescence 128, 297 (2008)

    Article  ADS  Google Scholar 

  27. R.T. Tung, Phys. Rev. B 45, 13509 (1992)

    Article  ADS  Google Scholar 

  28. S. Zhu, R.L. Van Meirhaeghe, C. Detavernier, F. Cardon, G.P. Ru, X.P. Qu, B.Z. Li, Solid State Electron. 44, 663 (2000)

    Article  ADS  Google Scholar 

  29. A. Hu, W. Wang, Q. Xu, J. Semicond. 30, 084001 (2009)

    Article  Google Scholar 

  30. G. Song, M.Y. Ali, M. Tao, Solid-State Electron. 52, 1778 (2008)

    Article  ADS  Google Scholar 

  31. F. Zhang, D. Liu, Y. Zhang, H. Wei, T. Song, B. Sun, ACS Appl. Mater. Interfaces 5, 4678 (2013)

    Article  Google Scholar 

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Acknowledgments

The authors acknowledge the support of the Ministry of Science and Technology, Taiwan (Contract No. 103-2112-M-018-003-MY3) in the form of Grants.

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Authors and Affiliations

  1. Institute of Photonics, National Changhua University of Education, Changhua, 500, Taiwan

    Yow-Jon Lin, Cheng-He Ruan & Yu-Ju Chu

  2. Department of Physics, National Changhua University of Education, Changhua, 500, Taiwan

    Chia-Jyi Liu & Fei-Hung Lin

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  1. Yow-Jon Lin
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  2. Cheng-He Ruan
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Correspondence to Yow-Jon Lin.

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Lin, YJ., Ruan, CH., Chu, YJ. et al. Correlation between interface modification and rectifying behavior of p-type Cu2ZnSnS4/n-type Si diodes. Appl. Phys. A 121, 103–108 (2015). https://doi.org/10.1007/s00339-015-9390-y

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  • DOI: https://doi.org/10.1007/s00339-015-9390-y

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