Abstract
In view ofK-fault testability, the topological construction of a practical circuit is far from ideal. In order to improve the testability of a circuit, we may increase the number of accessible nodes or use the multi-excitation method. Effectiveness of these methods and the feasibility of choosing accessible nodes are discussed in detail. The conditions for multi-excitation testability are presented.
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References
Zheng F. Huang, Cheng-Shang Lin, Ruey-Wen Liu, “Node-fault diagnosis and a Design of Testability”,IEEE Trans. on CAS,CAS-30(1983), 257–265.
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The work was supported by National Science Foundation of China.
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Wu, Y., Tong, S.B. The effective range of k-fault diagnosis of linear circuits. J. of Electron.(China) 7, 207–214 (1990). https://doi.org/10.1007/BF02778421
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DOI: https://doi.org/10.1007/BF02778421