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Identification of models using failure rate and mean residual life of doubly truncated random variables

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Abstract

In this paper, we study the relationship between the failure rate and the mean residual life of doubly truncated random variables. Accordingly, we develop characterizations for exponential, Pareto II and beta distributions. Further, we generalize the identities for the Pearson and the exponential family of distributions given respectively in Nair and Sankaran (1991) and Consul (1995). Applications of these measures in the context of lengthbiased models are also explored.

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Authors and Affiliations

  1. Department of Statistics, Cochin University of Science and Technology, 682 022, Cochin, India

    P. G. Sankaran & S. M. Sunoj

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  1. P. G. Sankaran
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  2. S. M. Sunoj
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Sankaran, P.G., Sunoj, S.M. Identification of models using failure rate and mean residual life of doubly truncated random variables. Statistical Papers 45, 97–109 (2004). https://doi.org/10.1007/BF02778272

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  • DOI: https://doi.org/10.1007/BF02778272

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