Abstract
Localized corrosion processes of passive metals are almost always initiated at local heterogeneities of the substrate material. In the case of stainless steels MnS inclusions are of primary importance. Increasing the temperature strongly accelerates the pitting. Detailed large-scale and microelectrochemical investigations show that this is mainly caused by an enhanced anodic dissolution facilitating stable pit growth and retarding repassivation. Activation of new inclusions, remaining inactive at lower temperature, may also occur but are of minor importance.
Similar content being viewed by others
References
Szklarska-Smialowska, Z.,Pitting Corrosion of Metals, Houston: NACE, 1986.
Sedriks, A.J.,Corrosion of Stainless Steels, Corrosion Monograph Series, New York: Wiley, 1996.
Brigham, R.J. and Tozer, E.W.,Corrosion, 1973, vol. 29, p. 33.
Matsch, S., Suter, T. and Böhni, H.,Mater. Sci. Forum, 1998, vol. 289-292, p. 1127.
Renner, M., Heubner, U., Rockel, M.B. and Wallis, E.,Werkstoffe Korros., 1986, vol. 8, p. 182.
Suter, T., Peter, T. and Böhni, H.,Mater. Sci. Forum, 1995, vol. 192-194, p. 25.
Suter, T.,PhD Thesis, ETH Zürich, no. 11962, 1997.
Matsch, St. and Böhni, H., inCritical Factors in Localized Corrosion, III, The Electrochem. Soc., PV., 1998, vol. 98/17, p. 421.
Matsch, St.,PhD Thesis, ETH, Zürich, no. 13258, 1999.
Suter, T. and Böhni, H.,Electrochim. Acta, 1997, vol. 42, p. 3275.
Suter, T. and Böhni, H.,Electrochim. Acta, 1998, vol. 43, p. 2843.
Böhni, H., Suter, T. and Schreyer, A.,Electrochim. Acta, 1995, vol. 40, p. 1361.
Salinas-Bravo, V.M. and Newman, R.C.,Corros. Sci., 1994, vol. 36, p. 67.
Laycock, N.J. and Newman, R.C.,Corros. Sci., 1998, vol. 40, p. 88.
Author information
Authors and Affiliations
Additional information
Dedicated to the ninetieth anniversary of Ya.M. Kolotyrkin’s birth.
This article was submitted by the authors in English.
Rights and permissions
About this article
Cite this article
Matsch, S., Böhni, H. Influence of temperature on the localized corrosion of stainless steels. Russ J Electrochem 36, 1122–1128 (2000). https://doi.org/10.1007/BF02757532
Received:
Issue Date:
DOI: https://doi.org/10.1007/BF02757532