Abstract
Dielectric properties andI–V characteristics of solution-gas interface-formed PbS thin-film capacitors (Al/PbS/Al) of various thicknesses have been studied in the frequency range 10-106 Hz at various temperatures (300–443 K). Current-voltage (I–V) characteristics show space-charge-limited conduction. Dielectric constant (ε) increases with increasing film thickness and temperature and decreases with increase of frequency. The loss factor (tanδ) peaks observed in tanδ vs frequency and tanδ vs temperature reveal relaxation effect from dipolar orientation. These maxima shift to higher-temperature region with increasing frequency. The large increase in capacitance (C) and dielectric constant (ε) towards low-frequency (f) region indicates the possibility of an interfacial polarization mechanism in this region.
This is a preview of subscription content, log in via an institution to check access.
Similar content being viewed by others
References
Acharya H N and Bose H N 1971Phys. Stat. Sol. (a) 6 K 43
Acharya H N and Bose H N 1979Indian J. Pure Appl. Phys. A53 6
Beamo W R 1965Electronics of solids (New York: McGraw-Hill) p. 385
Blount G H, Schriber P J, Smith D K and Yamada R T 1973J. Appl. Phys. 44 978
Burger P A, Malan O G, Kunzo O A and Fink W 1971Z. Naturforsch. 26 132
Debye P 1929Polar molecules (New York: Dover)
Espvik S, Chem-Ho-Wu and Bube R H 1971J. Appl. Phys. 42 3513
Goswami A and Dharmadhikari V S 1982Thin Solid Films 87 119
Kothiyal G P, Deshpande R Y and Ghose B 1976Proc. Nucl. Phys. Solid State Phys. Symp. 19(C) 115
Kothiyal G P, Ghose B and Deshpande R Y 1980J. Phys., D, Appl. Phys. 13 869
Lamb D R 1967Electrical conduction mechanism in thin insulating films (London: Methuen)
Lampert M A 1956Phys. Rev. 103 1648
Lampert M A, Rose A and Smith R W 1959Phys. Chem. Solids 8 484
Landry M J and Langley R A 1979Thin Solid Films 67 171
Nadkarni G S and Simmons J G 1970J. Appl. Phys. 41 545
Nair P K, Ocampo M, Fernandez A and Nair M Ts 1990Solar Energy Mater. 20 235
Nikam P S and Aher H S 1993Indian J. Pure Appl. Phys. 31 79
Nikam P S and Pathan K A 1993Indian J. Pure Appl. Phys. (in press)
Paramasivan K R, Radhakrishnan M and Balsubramanian C 1980Thin Solid Films 74 189
Peek D, Guerra V C and Sladek R J 1985J. Appl. Phys. 57 4803
Rose A 1955Phys. Rev. 97 1538
Simmons J G, Nadkarni G S and Lancaster M C 1970J. Appl. Phys. 41 538
Von Hippel A, Gross E P, Telstis F G and Geller A 1953Phys. Rev. 91 568
Wert C A 1950Phys. Rev. 79 601
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Nikam, P.S., Pathan, K.A. Electric and dielectric properties of solution-gas interface-grown PbS films. Bull. Mater. Sci. 17, 245–252 (1994). https://doi.org/10.1007/BF02745176
Received:
Revised:
Issue Date:
DOI: https://doi.org/10.1007/BF02745176