Abstract
The electronic properties of silicon nanostructures are calculated using a timedependent algorithm within the tight-binding approximation. The algorithm includes the electron-hole Coulomb interaction directly without resort to perturbative correction, allowing accurate calculation of excited state properties. The densities of states, fundamental band gaps, photoluminescence energies, and band edge eigenfunctions andk-distributions are calculated for nanostructures up to 100Å in diameter. The effects of size, geometry, surface termination, and surface reconstruction on the electronic properties are investigated. We show that a model in which the primary photoluminescence peak is due to exciton recombination across the fundamental gap, while the secondary infra-red peak is due to recombination of a conduction band electron with a hole in a deep surface trap is consistent with recent observations for both silicon nanocrystals and porous silicon. We infer the geometry of the luminescent region in porous silicon by comparing our calculated results with experimental data on porous silicon samples.
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Hill, N.A., Whaley, K.B. A theoretical study of light emission from nanoscale silicon. J. Electron. Mater. 25, 269–285 (1996). https://doi.org/10.1007/BF02666256
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DOI: https://doi.org/10.1007/BF02666256