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Electron microscopy of transformation dislocations at interphase boundaries

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Abstract

The concept of structural units (SU’s) developed in order to describe the atomic structures of twin boundary facets is also used for interphase boundary (IB) facets quasi-parallel to small near-coincident planar cells of the two adjacent lattices. These facets, which have their own SU’s, are separated by transformation dislocations (TD’s), the cores of which are often related to ledges having heights equal to several interplanar spacings. It is shown that the Somigliana dislocation (SD) concept is a good tool for the computation of elastic displacement fields of these TD’s in anisotropic elasticity. Applications are presented concerning the following IB’s observed in high-resolution transmission electron microscopy (HRTEM): Si/TiSi2, Si/CoSi2, and Ni3Al/Ni3Nb. The identification of the atomic rows around some TD’s at Si/CoSi2 and Ni3Al/Ni3Nb has been obtained by careful comparisons of experimental and calculated images.

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Authors and Affiliations

  1. Institut National Polytechnique de Grenoble, 38402, Saint Martin D’Hères Cedex, France

    R. Bonnet (Director of Research of CNRS) & M. Loubradou (Teaching Associate)

  2. IBM at Zürich, Switzerland

    A. Catana (Staff Research Engineer)

  3. Institut of Electron Microscopy, Ecole Polytechnique Fédérale de Lausanne, Switzerland

    P. Stadelmann (Professor)

Authors
  1. R. Bonnet
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  2. M. Loubradou
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  3. A. Catana
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  4. P. Stadelmann
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Additional information

This paper is based on a presentation made in the symposium “The Role of Ledges in Phase Transformations” presented as part of the 1989 Fall Meeting of TMS-MSD, October 1–5, 1989, in Indianapolis, IN, under the auspices of the Phase Transformations Committee of the Materials Science Division, ASM INTERNATIONAL.

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Bonnet, R., Loubradou, M., Catana, A. et al. Electron microscopy of transformation dislocations at interphase boundaries. Metall Trans A 22, 1145–1158 (1991). https://doi.org/10.1007/BF02660646

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