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The growth and structure of thin oxide films on cerium ion-implanted nickel

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Abstract

Cerium ions were implanted into a high purity polycrystalline Ni to a dose of 2 × 1016 Ce+/cm2. The radiation damage and distribution of Ce in Ni substrate were modified by postimplantation vacuum annealing. The Ce implants significantly decreased the NiO growth rate at 973 K. Thin oxide films formed on implanted Ni were composed of three well-defined sublayers, each with an essentially different microstructure. Cerium was present in the near surface region of the oxide in the form of CeO2 particles, randomly distributed in NiO matrix, and Ce ion segregants at NiO grain boundaries. The size of CeO2 particles, formed during the initial stages of exposure to oxygen, affected the inhibition of oxide growth. Vacuum annealing following implantation decreased the beneficial effect of Ce implants by increasing the size of CeO2 particles. The role of Ce implants in inhibiting grain boundary diffusion in NiO is analyzed. As a result of this study, the growth mechanism of thin NiO films on Ce-implanted Ni is proposed.

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References

  1. D.P. Whittle and J. Stringer:Phil. Trans. Soc. London, 1980, vol. A295, vol. pp. 309–29.

    Google Scholar 

  2. K. Przybylski and G.J. Yurek:Mater. Sci. Forum, 1989, vol. 43, pp. 1–75.

    CAS  Google Scholar 

  3. M.J. Bennett and A.T. Tuson:Mater. Sci. Eng., 1989, vol. A116, pp. 79–87.

    Google Scholar 

  4. C.H. Yang, G. Welsch, and T.E. Mitchell:J. Mater. Sci., 1990, vol. 25, pp. 1724–38.

    Article  CAS  Google Scholar 

  5. J.M. Hampikian and D.I. Potter:Oxid. Met., 1992, vol. 38, pp. 139–64.

    Article  CAS  Google Scholar 

  6. J. Jedlinski and G. Borchard:Oxid. Met., 1991, vol. 36, pp. 317–36.

    Article  CAS  Google Scholar 

  7. B.A. Pint:Ph.D. Thesis, Massachusetts Institute of Technology, Cambridge, MA, 1992.

    Google Scholar 

  8. N. Nath, N. Eyre, and G. Deamaley:Nucl. Instrum. Met. Phys. Res., 1985, vols. B10–B11, pp. 580–82.

    Article  Google Scholar 

  9. P.J. George, M.J. Bennett, H.E. Bishop, and G. Dearnaley:Mater. Sci. Eng., 1989, vol. A116, pp. 111–17.

    Google Scholar 

  10. J.G. Smeggil, A.J. Shuskus, C.T. Burilla, and R.J. Cipolli:Surf. Coat. Technol., 1989, vol. 36, pp. 27–36.

    Article  Google Scholar 

  11. J.M. Hampikian, O.F. Devereux, and D.I. Potter:Mater. Sci. Eng., 1989, vol. A116, pp. 119–27.

    Google Scholar 

  12. C.M. Cotell, G.J. Yurek, R.J. Hussey, D.F. Mitchell, and M.J. Graham:J. Electrochem. Soc., 1987, vol. 134, pp. 1871–72.

    Article  CAS  Google Scholar 

  13. D.P. Moon and M.J. Bennett:Mater. Sci. Forum, 1989, vol. 43, pp. 269–98.

    CAS  Google Scholar 

  14. F. Czerwinski and W.W. Smeltzer:Oxid. Met., 1993, vol. 40, pp. 503–27.

    Article  CAS  Google Scholar 

  15. B. Pieraggi and R.A. Rapp:J. Electrochem. Soc., 1993, vol. 140, pp. 2844–50.

    Article  CAS  Google Scholar 

  16. J. Jedlinski:Oxid. Met., 1993, vol. 39, pp. 55–68.

    Article  CAS  Google Scholar 

  17. P.Y. Hou, Z.R. Shui, G.Y. Chuang, and J. Stringer:J. Electrochem. Soc., 1992, vol. 139, pp. 1119–25.

    Article  CAS  Google Scholar 

  18. F. Czerwinski and W.W. Smeltzer:J. Electrochem. Soc., 1993, vol. 140, pp. 2606–15; 1994, vol. 141, p. L34.

    Article  CAS  Google Scholar 

  19. W.W. Smeltzer:Mater. Sci. Forum, 1988, vol. 29, pp. 151–72.

    Article  CAS  Google Scholar 

  20. E. Chason, Ch.M. Falco, A. Ourmazd, E.F. Schubert, J.M. Slaughter, and R.S. Williams: inEvolution of Surface and Thin Film Microstructure, Materials Research Society Symposia Proceedings, H.A. Atwater, E. Chason, M.H. Grabow, and M.G. Legally, eds., Materials Research Society, Pittsburgh, PA, 1992, vol. 280, pp. 203–39.

    Google Scholar 

  21. J.M. Bennett and L. Mattsson:Introduction to Surface Analysis and Scattering. Optical Society of America, Washington, DC, 1989.

    Google Scholar 

  22. F. Czerwinski, J.A. Szpunar, R.G. Macaulay-Newcombe, and W.W. Smeltzer:Oxid. Met., 1995, vol. 43, pp. 25–57.

    Article  CAS  Google Scholar 

  23. A.T. Chadwick and R.I. Taylor:Solid State Ionics, 1984, vol. 12, pp. 343–51.

    Article  CAS  Google Scholar 

  24. J.F. Ziegler, J.P. Biersack, and U. Littmark:The Stopping Power and Range of Ions in Solids, Pergamon Press, Oxford United Kingdom, 1985.

    Google Scholar 

  25. R.D. Leapman, C.E. Fiori, and C.R. Swyt:J. Microsc., 1984, vol. 133, pp. 239–53.

    CAS  Google Scholar 

  26. T. Malis, S.C. Cheng, and R.F. Egerton:J. Electron Microsc. Technol., 1988, vol. 8, pp. 193–200.

    Article  CAS  Google Scholar 

  27. V. Srnivasan, G.H. Meier, A.W. McCormick, and A.K. Rai:Nucl. Instrum. Met. Phys. Res., 1986, vol. B16, 293–300.

    Article  Google Scholar 

  28. J.M. Hampikian and D.I. Potter:Oxid. Met., 1992, vol. 38, pp. 125–38.

    Article  CAS  Google Scholar 

  29. D. Potter and A. McCormick:Acta Metall., 1979, vol. 27, pp. 933–41.

    Article  CAS  Google Scholar 

  30. D. Schumacher, W. Schule, and A. Seeger:Naturforsch., 1962, vol. A17, p. 228.

    Google Scholar 

  31. M. Ahmed and D.I. Potter:Acta Metall., 1987, vol. 9, pp. 2341–54.

    Google Scholar 

  32. F. Czerwinski, G.I. Sproule, M.J. Graham, and W.W. Smeltzer:Corros. Sci., 1995, vol. 37, pp. 541–56.

    Article  CAS  Google Scholar 

  33. F. Czerwinski and W.W. Smeltzer: inMicroscopy of Oxidation 2, S.B. Newcomb and M.J. Bennett, eds., The Institute of Materials, London, 1993, pp. 119–27.

    Google Scholar 

  34. R.A. Rapp:Metall. Trans. A, 1984, vol. 15A, pp. 765–82.

    CAS  Google Scholar 

  35. A. Atkinson, R.I. Taylor, and A.E. Hughes:Phil. Mag., 1982, vol. A45, pp. 823–33.

    Google Scholar 

  36. A. Atkinson and R.I. Taylor:Phil. Mag., 1979, vol. A39, pp. 581–95.

    Google Scholar 

  37. A. Atkinson and R.I. Taylor:Phil. Mag., 1981, vol. A43, pp. 979–98.

    Google Scholar 

  38. F. Czerwinski and J.A. Szpunar:Can. Metall. Q., 1995, vol. 34, pp. 243–49.

    Article  Google Scholar 

  39. D.M. Duffy and P.W. Tasker:Phil. Mag., 1986, vol. A54, pp. 759–71.

    Google Scholar 

  40. P. Kofstad:High Temperature Corrosion, Elsevier, London, 1988.

    Google Scholar 

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Authors and Affiliations

  1. the Department of Metallurgical Engineering, McGill University, H3A 2A7, Montreal, PQ, Canada

    F. Czerwinski (Research Associate) & J. A. Szpunar (Professor)

  2. the Institute for Materials Research, McMaster University, L8S 4M1, Hamilton, ON, Canada

    W. W. Smeltzer (Emeritus Professor)

Authors
  1. F. Czerwinski
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  2. J. A. Szpunar
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  3. W. W. Smeltzer
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Czerwinski, F., Szpunar, J.A. & Smeltzer, W.W. The growth and structure of thin oxide films on cerium ion-implanted nickel. Metall Mater Trans A 27, 3649–3661 (1996). https://doi.org/10.1007/BF02595456

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