Abstract
Ion beam mixing in Fe-Pd bilayers evaporated onto SiO2 substrates has been studied using Rutherford backscattering spectrometry and Mössbauer spectroscopy. To achieve some depth selectivity in the Mössbauer measurements, a 5 nm thick57Fe layer was evaporated at either the Pd-Fe interface or the Fe-substrate interface. A disordered FePd3 phase is formed predominantly in the mixed region. The underlying unmixed Fe layer does not undergo any structural phase transformation.
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Gupta, A., Princip, G., Battaglin, G. et al. CEMS characterization of Kr++ irradiated Fe-Pd bilayers. Hyperfine Interact 56, 1587–1592 (1990). https://doi.org/10.1007/BF02405479
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DOI: https://doi.org/10.1007/BF02405479