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Vantomme, A., Dézsi, I. & Langouche, G. Mössbauer spectroscopy and rutherford backscattering study of Co-Silicide surface layers on Si. Hyperfine Interact 41, 725–728 (1988). https://doi.org/10.1007/BF02400493
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DOI: https://doi.org/10.1007/BF02400493