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A comparative study of muonium states in crystalline and amorphous hydrogenated silicon

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Abstract

A study of muons implanted into amorphous hydrogenated silicon (a-Si: H), using both transverse and longitudinal field μSR, is presented. Particular use is made of the muon repolarization curves in longitudinal fields. By comparison with the results of similar measurements on polycrystalline silicon, both the diamagnetic and Mu* fractions are found to be substantially increased. We postulate that weak strained bonds in the amorphous structure are responsible. Little evidence has been found from longitudinal field measurements for isotropic muonium Mu', and a transverse field experiment on a-Si: D suggests that this state might not exist in the amorphous material.

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Authors and Affiliations

  1. Rutherford Appleton Laboratory, ISIS Pulsed Muon Facility, OX11 0QX, Chilton, Oxon, UK

    S. F. J. Cox

  2. Department of Physics and Astronomy, University of Leicester, LE1 7RH, Leicester, UK

    E. A. Davis & A. Singh

  3. Clarendon Laboratory, University of Oxford, OX1 3PU, Oxford, UK

    W. Hayes & F. L. Pratt

  4. Department of Chemistry, University of Leicester, LE1 7RH, Leicester, UK

    M. C. R. Symons & T. A. Claxton

  5. J.J. Thomson Physical Laboratory, University of Reading, Whiteknights, RG6 2AF, Reading, UK

    A. Wright

  6. Xerox Webster Research Centre, 14580, Webster, NY, USA

    F. Jansen

Authors
  1. S. F. J. Cox
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  2. E. A. Davis
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  3. W. Hayes
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  4. M. C. R. Symons
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  5. A. Wright
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  6. A. Singh
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  7. F. L. Pratt
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  8. T. A. Claxton
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  9. F. Jansen
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Cox, S.F.J., Davis, E.A., Hayes, W. et al. A comparative study of muonium states in crystalline and amorphous hydrogenated silicon. Hyperfine Interact 64, 551–560 (1991). https://doi.org/10.1007/BF02396189

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  • DOI: https://doi.org/10.1007/BF02396189

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