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Increasing item complexity: A possible cause of scale shrinkage for unidimensional item response theory

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Abstract

When the three-parameter logistic model is applied to tests covering a broad range of difficulty, there frequently is an increase in mean item discrimination and a decrease in variance of item difficulties and traits as the tests become more difficult. To examine the hypothesis that this unexpected scale shrinkage effect occurs because the items increase in complexity as they increase in difficulty, an approximate relationship is derived between the unidimensional model used in data analysis and a multidimensional model hypothesized to be generating the item responses. Scale shrinkage is successfully predicted for several sets of simulated data.

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References

  • CTB/McGraw-Hill. (1981).Comprehensive tests of basic skills, forms U & V. Monterey, CA: Author.

    Google Scholar 

  • CTB/McGraw-Hill. (1982).Comprehensive tests of basic skills, forms U & V, test coordinator's handbook. Monterey, CA: Author.

    Google Scholar 

  • CTB/McGraw-Hill. (1984).Comprehensive tests of basic skills, forms U & V, technical report. Monterey, CA: Author.

    Google Scholar 

  • Doody-Bogan, E., & Yen, W. M. (1983, April).Detecting multidimensionality and examining its effects on vertical equating with the three-parameter logistic model. Paper presented at the meeting of the American Educational Research Association, Montreal.

  • International Mathematical and Statistical Libraries. (1979).IMSL Library (7th ed.). Houston, TX: Author.

    Google Scholar 

  • Lord, F. M. (1975). The “ability” scale in item characteristic curve theory.Psychometrika, 40, 205–217.

    Article  Google Scholar 

  • Lord, F. M. (1980).Applications of item response theory to practical testing problems. New York: Lawrence Erlbaum.

    Google Scholar 

  • Lord, F. M. (1984).Conjunctive and disjunctive item response functions. (Technical Report). Princeton, NJ: Educational Testing Service.

    Google Scholar 

  • McKinley, R. L. (1983, April).A multidimensional extension of the two-parameter logistic latent trait model. Paper presented at the meeting of the National Council on Measurement in Education, Montreal.

  • Mislevy, R. J. (1984), Estimating latent distributions.Psychometrika, 49, 359–381.

    Google Scholar 

  • Reckase, M. D. (1979). Unifactor latent trait models applied to multifactor tests: Results and implications.Journal of Educational Statistics, 4, 207–230.

    Google Scholar 

  • Reckase, M. D., & McKinley, R. L. (1983, April).The definition of difficulty and discrimination for multidimensional item response theory models. Paper presented at the meeting of the American Educational Research Association, Montreal.

  • Wingersky, M. S., Barton, M. A., & Lord, F. M. (1982),LOGIST User's Guide. Princeton, NJ: Educational Testing Service.

    Google Scholar 

  • Yen, W. M. (1983a). Tau equivalence and equipercentile equating.Psychometrika, 48, 353–369.

    Article  Google Scholar 

  • Yen, W. M. (1983b). Use of the three-parameter logistic model in the development of a standardized achievement test. In R. K. Hambleton (Ed.),Applications of Item Response Theory. British Columbia: Educational Research Institute of British Columbia.

    Google Scholar 

  • Yen, W. M. (1984). Effects of local item dependence on the fit and equating performance of the three-parameter logistic model.Applied Psychological Measurement, 8, 125–145.

    Google Scholar 

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The author is grateful to Robert Mislevy for kindly providing a copy of his computer program, RESOLVE.

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Yen, W.M. Increasing item complexity: A possible cause of scale shrinkage for unidimensional item response theory. Psychometrika 50, 399–410 (1985). https://doi.org/10.1007/BF02296259

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  • DOI: https://doi.org/10.1007/BF02296259

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