Skip to main content
SpringerLink
Log in

XRF induced by PIXE: Comparison with PIXE

  • Published:
Journal of Radioanalytical and Nuclear Chemistry Aims and scope Submit manuscript

Abstract

Two different modes of sample excitation have been used for elemental analysis of thin standard reference materials and of chemical standards with known composition. PIXE /2.5 MeV protons/ and XRF induced by PIXE, will be called XRF-PIXE /2.5 MeV protons on Mo primary target/. The same samples were alternatively exposed to protons and X-ray beams. The sensitivities under standard running conditions are determined for both an XRF-PIXE and a PIXE analysis system. It is shown that the sensitivity of the PIXE spectrometer depends strongly on the sample matrix, whereas the XRF-PIXE sensitivity is rather constant with respect to different kinds of samples. In addition, the advantages of one mode of excitation on the other are discussed. It is shown that XRF-PIXE can be a useful complement to PIXE analysis.

This is a preview of subscription content, log in via an institution to check access.

Access this article

Log in via an institution

Price excludes VAT (USA)
Tax calculation will be finalised during checkout.

Instant access to the full article PDF.

Institutional subscriptions

Similar content being viewed by others

References

  1. L. Grodzins, P. Boisseau,IEEE Trans., NS-30 /1983/ 171.

    Google Scholar 

  2. T.-L. Lin, C.-S. Luo, J.-C. Chou,Nucl. Instr. and Meth., 151 /1978/ 439.

    Google Scholar 

  3. K. A. Al-Saleh, J. D. Meyer, N. S. Saleh,Appl. Phys., A42 /in press/.

  4. N. Saleh, A. Hallak, K. Al-Saleh, D. E. Arafah,Appl. Phys. Comm., 5 /1986/ 53.

    Google Scholar 

  5. I. J. Jabr, N. S. Saleh, A. B. Hallak,Nucl. Instr. and Meth. in Physics, Research B /in press/.

  6. R. Jenkins, An Introduction to X-ray Spectrometry, London, Heyden and Son Ltd., 1974, p. 11.

    Google Scholar 

  7. C. J. Sparks,Advances in X-ray Analysis, 19 /1975/ 19.

    Google Scholar 

  8. R. D. Giauque, F. S. Goulding, J. M. Jaklevic, R. H. Pehl,Anal. Chem., 45 /1973/ 671.

    Google Scholar 

  9. I. V. Mitchell, K. M. Barfood,Nucl. Sci. Applications, 1 /1981/ 99.

    Google Scholar 

  10. C. Bahn, S. N. Chaturvedi, N. Nath,X-ray Spectrometry, 10 /1981/ 18.

    Google Scholar 

  11. G. Lagarde, J. Cailleret, C. Heitz,Nucl. Instr. and Meth., 205 /1983/ 545.

    Google Scholar 

  12. M. Alberg, G. Johansson, K. Malmqvist,Nucl. Instr. and Meth., 131 /1976/ 377.

    Google Scholar 

Download references

Author information

Authors and Affiliations

  1. Department of Physics, University of Jordan, Amman, Jordan

    N. S. Saleh & K. A. Al-Saleh

Authors
  1. N. S. Saleh
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. K. A. Al-Saleh
    View author publications

    You can also search for this author in PubMed Google Scholar

Rights and permissions

Reprints and permissions

About this article

Cite this article

Saleh, N.S., Al-Saleh, K.A. XRF induced by PIXE: Comparison with PIXE. Journal of Radioanalytical and Nuclear Chemistry Letters 108, 363–373 (1987). https://doi.org/10.1007/BF02165093

Download citation

  • Received:

  • Accepted:

  • Issue Date:

  • DOI: https://doi.org/10.1007/BF02165093

Keywords

Search

Navigation