Abstract
Thin targets of rare earth fluorides were bombarded with 66 and 85 MeV protons. Measured cross sections for X-ray production agreed with PWBA calculations. Satellite X-rays from nuclear reactions were obtained for both (Z-1) and (Z+1) products from the bombardment of element Z. Interference-free sensitivities were of the order of tens of nanograms under bombardment with 1 mC of integrated charge. The technique was applied for the analysis of geological ores and standards.
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Pineda, C.A., Peisach, M. Prompt analysis of rare earths by high-energy PIXE. Journal of Radioanalytical and Nuclear Chemistry, Articles 151, 387–396 (1991). https://doi.org/10.1007/BF02035499
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DOI: https://doi.org/10.1007/BF02035499