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Examination of thin films of low pressure diamond by transmission electron microscopy

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Journal of Materials Science Letters

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Authors and Affiliations

  1. AB SANDVIK Coromant, S-126 12, Stockholm, Sweden

    Ch. Chatfield

  2. Institute for Chemical Technology of Inorganic Materials, Technical University Vienna, A-1060, Vienna, Austria

    R. Haubner & B. Lux

Authors
  1. Ch. Chatfield
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  2. R. Haubner
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  3. B. Lux
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Chatfield, C., Haubner, R. & Lux, B. Examination of thin films of low pressure diamond by transmission electron microscopy. J Mater Sci Lett 8, 1188–1192 (1989). https://doi.org/10.1007/BF01730066

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  • DOI: https://doi.org/10.1007/BF01730066

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