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Defect identification in vapour-grownβ-SiC whiskers

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Journal of Materials Science Letters

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References

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Author notes

  1. T. Yoshiie

    Present address: Faculty of Engineering, Hokkaido University, Sapporo, Japan

Authors and Affiliations

  1. Faculty of Liberal Arts, and Department of Materials Science and Engineering, Faculty of Engineering, Nagasaki University, 852, Nagasaki, Japan

    H. Katuki & M. Egashira

  2. Institute for Solid State Physics, University of Tokyo, Roppongi, Minato-ku, 106, Tokyo, Japan

    S. Takeuchi

Authors
  1. H. Iwanaga
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  2. T. Yoshiie
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  3. H. Katuki
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  4. M. Egashira
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  5. S. Takeuchi
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Iwanaga, H., Yoshiie, T., Katuki, H. et al. Defect identification in vapour-grownβ-SiC whiskers. J Mater Sci Lett 5, 946–948 (1986). https://doi.org/10.1007/BF01729284

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  • DOI: https://doi.org/10.1007/BF01729284

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