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Influence of minority carrier diffusion length in determining the effects of base layer thickness of an n+p silicon solar cell and a BSF cell by numerical analysis

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Journal of Materials Science Letters

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References

  1. P. C. DHANASEKARAN and B. S. V. GOPALAM,Solid State Electron. 24 (1981) 1077.

    Google Scholar 

  2. M. WOLF and E. L. RALPTH,IEEE Trans. Electron Dev. ED-12 (1965) 470.

    Google Scholar 

  3. H. K. GUMMEL,ibid. ED-11 (1964) 455.

  4. A. DE MARI,Solid State Electron. 11 (1968) 33.

    Google Scholar 

  5. J. W. SLOTBOOM and H. C. DE GRAAFF,ibid. 19 (1976) 859.

    Google Scholar 

  6. M. A. SHIBIB, F. A. LINDHOLM and F. THEREZ,IEEE Trans. Electron Dev. ED-26 (1979) 959.

    Google Scholar 

  7. J. G. FOSSUM,Solid State Electron. 19 (1976) 269.

    Google Scholar 

  8. D. KENDALL, Conference on the Physics and Application of Lithium Diffused Silicon, NASA-Goddard Space Flight Center December 1969.

  9. M. P. THEKAEKARA,J. Environmetal Sci. 13 (1970) 6.

    Google Scholar 

  10. J. R. HAUSER and P. M. DUNBAR,IEEE Trans. Electron Dev. ED-24 (1977) 305.

    Google Scholar 

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Dhanasekaran, P.C., Gopalam, B.S.V. Influence of minority carrier diffusion length in determining the effects of base layer thickness of an n+p silicon solar cell and a BSF cell by numerical analysis. J Mater Sci Lett 6, 1156–1160 (1987). https://doi.org/10.1007/BF01729168

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  • DOI: https://doi.org/10.1007/BF01729168

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