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Energieverlustmessungen von schnellen Elektronen an Oberflächen von Ga, In, Al und Si

Energy losses of fast electrons measured at surfaces of Ga, In, Al, and Si

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Zeitschrift für Physik B Condensed Matter

Abstract

The excitation of surface plasmons on liquid indium, gallium and aluminum surfaces as well as on silicon cleavage faces is studied by reflection of 10 keV electrons at grazing incidence (80° up to 89°). Due to the high excitation probability of surface plasmons at these large angles of incidence multiples of surface plasmons are observed. (Except on Si.) The Poisson distribution of the intensity of these energy losses is verified quantitatively as well as the dependence on (cosα)−1. The value of the excitation probability indicates that at grazing incidence the electrons are reflected just at the surface without penetrating into the volume. This is further demonstrated by the lack of volume plasmons. The surface loss positions in the solid and the liquid state show the calculated differences due to the density difference of both phases

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Authors and Affiliations

  1. Institut für Angewandte Physik, Universität Hamburg, Jungiusstraße 11, D-2000, Hamburg 36, Bundesrepublik Deutschland

    J. Schilling

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  1. J. Schilling
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Schilling, J. Energieverlustmessungen von schnellen Elektronen an Oberflächen von Ga, In, Al und Si. Z Physik B 25, 61–67 (1976). https://doi.org/10.1007/BF01343310

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  • DOI: https://doi.org/10.1007/BF01343310

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