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Photon emission with the scanning tunneling microscope

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Zeitschrift für Physik B Condensed Matter

Abstract

By placing a photon detector near the tip-sample region of a scanning tunneling microscope, we have measured isochromat photon-emission spectra of polycrystalline tantalum and Si(111)7×7 at photon energies of 9.5 eV. Such spectra contain electronic-structure information comparable to inverse photoemission spectroscopy, but with high lateral/spatial resolution. The implications of this new observation are discussed.

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Authors and Affiliations

  1. IBM Research Division, Zurich Research Laboratory, Säumerstrasse 4, CH-8803, Rüschlikon, Switzerland

    J. K. Gimzewski, B. Reihl, J. H. Coombs & R. R. Schlittler

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  1. J. K. Gimzewski
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  2. B. Reihl
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  3. J. H. Coombs
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  4. R. R. Schlittler
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Gimzewski, J.K., Reihl, B., Coombs, J.H. et al. Photon emission with the scanning tunneling microscope. Z. Physik B - Condensed Matter 72, 497–501 (1988). https://doi.org/10.1007/BF01314531

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  • DOI: https://doi.org/10.1007/BF01314531

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