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Measurement of the diffusion-length of carriers and excitons in CdS using laser-induced transient gratings

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Zeitschrift für Physik B Condensed Matter

Abstract

Using a laser-induced grating arrangement we measure the probe beam diffraction intensity under stationary excitation conditions as function of the grating constant. We developed a mathematical model and extract by comparison with experimental data the diffusion lengths of the quasiparticles existing at various temperatures and excitation levels in the CdS sample from the experimental findings.

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Weber, C., Becker, U., Renner, R. et al. Measurement of the diffusion-length of carriers and excitons in CdS using laser-induced transient gratings. Z. Physik B - Condensed Matter 72, 379–384 (1988). https://doi.org/10.1007/BF01312825

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  • DOI: https://doi.org/10.1007/BF01312825

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