Abstract
X-ray absorption spectroscopy (XAS) is a local probe of the geometric and electronic structure of individual atomic species in condensed matter. With the availability of intense, polarized and highly collimated X-rays from storage rings the technique has found a widespread application in physics, chemistry, biology and geology. Multiple scattering of the photoelectron in the edge region and in shadowing configurations makes it possible to deduce higher correlations in the atomic arrangement besides the pair correlation obtained from standard EXAFS. This gives radial and angular information on the geometric structure. A promising new application is XAS under total external reflection with detection of the absorption by fluorescence. This allows in-situ investigations of solid-solid, solid-liquid and solid-gas interfaces. New dedicated storage rings with high brilliance will have a major impact on XAS in dispersive mode and for very dilute systems.
Similar content being viewed by others
References
Stern, E.A.: Contemp. Phys.19, 289 (1978)
Lee, P.A., Citrin, P.H., Eisenberger, P., Kincaid, B.M.: Rev. Mod. Phys.53, 769 (1981)
Teo, B.K., Joy, D.C.: EXAFS spectroscopy. New York: Plenum Press 1981
Hayes, J.M., Boyce, T.B.: Solid State Phys37, 173 (1981)
Jaklevic, J., Kirby, J.A., Klein, M.P., Robertson, A.S., Brown, G.S., Eisenberger, P.: Solid State Commun.23, 679 (1977)
Citrin, P.H., Eisenberger, P., Hewitt, R.C.: Phys. Rev. Lett.41, 309 (1978)
Martens, G., Rabe, P., Schwentner, N.S., Werner, A.: J. Phys. C11, 3125 (1978)
Bianconi, A., Jackson, D., Monahan, K.: Phys. Rev. B17, 2021 (1978)
Sham, T.K., Holroyd, R.A.: J. Chem. Phys.80, 1026 (1984)
Teo, B.K., Lee, P.A.: J. Am. Chem. Soc.101, 2815 (1979)
Citrin, P.H., Eisenberger, P., Kincaid, B.M.: Phys. Rev. Lett.36, 1346 (1976)
Eisenberger, P., Lengeler, B.: Phys. Rev. B22, 3551 (1980)
Stern, E.A., Bunker, B.A., Heald, S.M.: Phys. Rev. B21, 5521 (1980)
Lengeler, B.: In: Microstructural characterization of materials by non-microscopical techniques. Hessel, Andersen, N., Eldrup, M., Hansen, N., Juul Jensen, D., Leffers, T., Lilholt, H., Pedersen, O.B., Singh, B.N. (eds.) Risø National Laboratory, Roskilde, Denmark (1984), p. 363
Using Mg instead of Al as backscatterer makes an error of 0.01 Å in the interatomic distance which has been corrected for in the analysis
Matsubara, E., Cohen, J.B.: Acta Metall.31, 2129 (1983)
Fontaine, A., Lagarde, P., Naudon, A., Raoux, D., Spanjaard, D.: Philos. Mag. B40, 17 (1979)
Lengeler, B., Eisenberger, P.: Decomposition of alloys: the early stages. Haasen, P., Gerold, V., Wagner, R., Ashby, M.F. (eds.), p. 121. 2nd Acta-Scripta Metallurgica Conference, Sept. 1983. New York: Pergamon Press 1984
Lengeler, B.: (to be published)
Marcus, M.A., Tsai, C.L., Giessen, B.C.: Solid State Commun.46, 455 (1983)
Raoux, D., Fontaine, A., Lagarde, P., Sadoc, A.: Phys. Rev. B24, 5547 (1981)
Lengeler, B., Pick, M.A.: Solid State Commun.53, 297 (1985)
Lengeler, B.: Phys. Rev. Lett. 53, 74 (1984)
Teo, B.K. In: EXAFS and near edge structure. In: Springer Series in Chemical Physics. Bianconi, A., Incoccia, L., Stipcich, S. (eds.) Vol. 27, p. 11. Berlin, Heidelberg, New York: Springer-Verlag 1983
Eisenberger, P., Brown, G.S.: Solid State Commun.29, 481 (1979)
Cargill, G.S.: J. Non-cryst. Solids61 & 62, 261 (1984)
Stern, E.A., Bouldin, C.E., Roedern, B. v., Azoulay, J.: Phys. Rev. B27, 6557 (1983)
Bouldin, C.E., Stern, E.A., Roedern, B. v., Azoulay, J.: Phys. Rev. B30, 4462 (1984)
Ibach, H.: Electron spectroscopy for surface analysis. p. 5. Berlin, Heidelberg, New York: Springer Verlag 1977
Müller, J.E., Jepsen, O., Andersen, O.K., Wilkins, J.W.: Phys. Rev. Lett.40, 720 (1978)
Müller, J.E., Wilkins, J.W.: Phys. Rev. B29, 4331 (1984)
Grunes, L.A.: Phys. Rev. B27, 2111 (1983)
Lengeler, B., Zeller, R.: Solid State Commun.51, 889 (1984)
Clausen, B.S., Lengeler, B., Rasmussen, B.S.: J. Phys. Chem. (1985)
Wong, J., Lytle, F.W., Messmer, R.P., Maylotte, D.H.: Phys. Rev. B30, 5596 (1984)
Hodgson, K.O., Hedman, B., Penner-Hahn, J.E. (eds.): EXAFS and near edge structure III. Proc. Int. Conf. Stanford CA, July 16–20 (1984). Berlin, Heidelberg, New York: Springer Verlag 1984
Smith, T.A., Penner-Hahn, J.E., Hodgson, K.O., Berding, M.A., Doniach, S.: In Ref. 36, p. 58
Bianconi, A., Dell'Ariccia, M., Durham, P.J., Pendry, J.B.: Phys. Rev. B26, 6502 (1982)
Bianconi, A., In Ref. 24
Proietti, M.G., Mobilio, S., Gargano, A., Incoccia, L., Evangelisti, F.: In Ref. 36, p. 26
Stöhr, J., Gland, J.L., Eberhardt, W., Outka, D., Madix, R.J., Sette, F., Koestner, R.J., Doebler, U.: Phys. Rev. Lett.51, 2414 (1983)
Stöhr, J., Sette, F., Johnson, A.L.: Phys. Rev. Lett.53, 1684 (1984)
Hitchcock, A.P., Sette, F., Stöhr, J.: In Ref 36, p. 43
Flank, A.M., Fontaine, A., Jucha, A., Lemonnier, M., Raoux, D., Williams, C.: Nucl. Instrum. Methods208, 651 (1983)
Dartyge, E., Fontaine, A., Jucha, A., Sayers, D.: In Ref. 36, pp. 472 and 209
Doniach, S., Bearding, M., Smith, T., Hodgson, K.O.: In Ref. 36, p. 33
Natoli, C.R.: In Ref. 36, p. 38
Natoli, C.R.: In Ref. 24
Boland, J.J., Crane, S.E., Baldeschwieler, J.D.: J. Chem. Phys.77, 142 (1982)
Vineyard, G.H.: Phys. Rev. B26, 4146 (1982)
Becker, R.S., Golovchenko, J.A., Patel, J.R.: Phys. Rev. Lett.50, 153 (1983)
Heald, S.M., Keller, E., Stern, E.A.: Phys. Lett.103 A, 155 (1984)
Stern, E.A., Keller, E., Petitpierre, D., Bouldin, C.E., Heald, S.M., Tranquada, J.: In Ref. 36, p. 261
Bosio, L., Cortes, R., Froment, M.: In Ref. 36, p. 484
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Lengeler, B. Applications of X-ray absorption spectroscopy in materials science: Status and new trends. Z. Physik B - Condensed Matter 61, 421–427 (1985). https://doi.org/10.1007/BF01303547
Received:
Issue Date:
DOI: https://doi.org/10.1007/BF01303547