EPMA analysis of float glass surfaces

Abstract

This work concentrates on the setting-up of conditions for the quantitative analysis of the composition profiles of major and minor components of float glass surfaces with an electron probe micro-analyser. Since surfaces are modified for depths of 10–50 μm, they have been studied both in polished cross-section and perpendicularly to the electron beam by varying its energy to investigate the near-surface region (0–3μm). The results demonstrate that combined use of the two methods supplies complete and continuous information on the quantitative distribution from large depths to the first layers of the float surfaces. The experimental conditions, sample preparation, in-depth and lateral resolutions, precision and accuracy of the methods are also investigated.