Abstract
Electron spin resonance spectra of thin films of amorphous MoO3 are presented. An increase in spin density associated with increased Mo(V) concentration is found to occur with increased substrate deposition temperature. Plots of spin density against film thickness show a linear relationship, and reveal a significant residual spin density when extrapolated to zero thickness. Resonance signals are observed atg = 1.92 andg = 2.0 which are attributed to Mo(V) and Mo(III), respectively; that atg = 1.92 vanishes on annealingin vacuo at 250° C. Colour centres observed at higher substrate temperatures are probably due to the presence of Mo(III).
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Anwar, M., Hogarth, C.A. & Lott, K.A.K. ESR studies of thin amorphous films of MoO3-effects of substrate temperature, film thickness and annealing procedures. J Mater Sci 24, 1660–1664 (1989). https://doi.org/10.1007/BF01105688
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DOI: https://doi.org/10.1007/BF01105688