Abstract
Some physical properties of CdS/p-Ge heterojunctions made by chemical vapour deposition of single crystal CdS epitaxial layers on (111)p-type nearly degenerate Ge substrates are reported. the equilibrium energy band diagram is discussed in the light of junction capacitance measurements as a function of frequency and of the reverse bias. The presence of interface states in the CdS band gap, with a density maximum at 1.1 eV below the equilibrium Fermi level has been shown. A model for the acceptor nature of the electronic states of misfit dislocations in CdS is suggested. The temperature dependence of theI-V characteristics has been measured in the temperature range 77–300 K. Models for the current flow in both direct and reverse bias conditions are discussed, taking into account the tunneling-recombination or generation-tunneling mechanisms throúgh interface states.
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C.Ghezzi, C.Paorici, C.Pelosi: to be published.
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Ghezzi, C., Paorici, C. & Pelosi, C. Some properties of CdS/p-Ge heterojunctions grown by chemical transport. Appl. Phys. 11, 327–335 (1976). https://doi.org/10.1007/BF00919361
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DOI: https://doi.org/10.1007/BF00919361