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Angular and surface roughness dependence of the electrical conductivity of thin metal films

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Journal of Materials Science Letters

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Authors and Affiliations

  1. Laboratoire de Chronométrie, Electronique et Piézoélectrićité, Ecole Nationale Supérieure de Mécanique et des Microtechniques, La Bouloie, Route de Gray, 25030, Besançon Cédex, France

    C. R. Tellier

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Tellier, C.R. Angular and surface roughness dependence of the electrical conductivity of thin metal films. J Mater Sci Lett 3, 464–468 (1984). https://doi.org/10.1007/BF00724393

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  • DOI: https://doi.org/10.1007/BF00724393

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