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High resolution scanning electron microscopy of PAN-based and pich-based carbon fibre

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Journal of Materials Science Letters

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Author notes

  1. D. L. Vezie

    Present address: Department of Materials Science and Engineering, Massachusetts Institute of Technology, 02139, Cambridge, MA, USA

Authors and Affiliations

  1. Universal Energy Systems, Inc., 45432, Dayton, OH, USA

    D. L. Vezie

  2. Polymer Branch, Materials Laboratory, Wright Research and Development Center, 45433-6533, Wright-Patterson Air Force Base, OH, USA

    W. W. Adams

Authors
  1. D. L. Vezie
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  2. W. W. Adams
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Vezie, D.L., Adams, W.W. High resolution scanning electron microscopy of PAN-based and pich-based carbon fibre. J Mater Sci Lett 9, 883–887 (1990). https://doi.org/10.1007/BF00722159

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  • DOI: https://doi.org/10.1007/BF00722159

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