Abstract
The range of chaotic behavior in the Josephson effect is investigated experimentally in tin tunnel junctions and indium microbridges subjected to dc and rf bias. Chaos is found to occur between frequencies of 0.1/(2πRC) and the plasma frequency at intermediate hysteresis. The low-hysteresis onset of chaos is studied systematically by varying the critical current of an Sn/ox/Sn tunnel junction as a function of temperature. The results agree with simulations and theoretical predictions.
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Noeldeke, C., Gross, R., Bauer, M. et al. Experimental survey of chaos in the Josephson effect. J Low Temp Phys 64, 235–268 (1986). https://doi.org/10.1007/BF00685131
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DOI: https://doi.org/10.1007/BF00685131