Abstract
The difference between surface roughness amplification and dendritic growth in copper electrodeposition in the limiting current density range is shown. The critical overpotential of copper dendrite growth is determined as 550 mV.
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References
N. Ibl, in ‘Advances in Electrochemistry and Electrochemical Engineering’, Vol. 2, Interscience, New York (1962).
J. Atanasiu and A. Calusaru,Studii cerc. metal. 2 (1957) 337.
Idem, Chem. Abstr. 52 (1957) 13 470h.
A. R. Despić,Croat. Chem. Acta 42 (1970) 265.
A. R. Despić and K. I. Popov, in ‘Modern Aspects of Electrochemistry’, Vol. 7, Plenum Press, New York, (1972).
J. L. Barton and J. O'M. Bockris,Proc. Royal Soc. A268 (1962) 485.
J. W. Diggle, A. R. Despić and J. O'M. Bockris,J. Electrochem. Soc. 116 (1969) 1503.
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Popov, K.I., Djukić, L.M., Pavlović, M.G. et al. The critical overpotential for copper dendrite formation. J Appl Electrochem 9, 527–531 (1979). https://doi.org/10.1007/BF00617565
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DOI: https://doi.org/10.1007/BF00617565