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TEM image contrast from clustering in Ga-In containing III–V alloys

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Abstract

The fine grainy contrast observed in TEM images of the Ga-In containing III–V alloys GaInP, GaInAs, and GaInAsP is interpreted as direct evidence of alloy clustering. A simple model is proposed in which clustering modulates the average lattice spacing throughout the crystal. For a sinusoidal modulation, solutions of the coupled two-beam dynamical diffraction equations in the column approximation show large intensity fluctuations when the modulation wavelength is comparable to the extinction distance.

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Gowers, J.P. TEM image contrast from clustering in Ga-In containing III–V alloys. Appl. Phys. A 31, 23–27 (1983). https://doi.org/10.1007/BF00617184

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  • DOI: https://doi.org/10.1007/BF00617184

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